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Controled Mouse Scanning Electron Microscope Sem 8x~800000x Magnification

Categories Scanning Microscope
Brand Name: OPTO-EDU
Model Number: A63.7080
Certification: CE, Rohs
Place of Origin: China
MOQ: 1 pc
Price: FOB $1~1000, Depend on Order Quantity
Payment Terms: T/T, West Union, Paypal
Supply Ability: 5000 pcs/ Month
Delivery Time: 5~20 Days
Packaging Details: Carton Packing, For Export Transportation
Resolution: 1.5nm@15KV(SE); 3nm@20KV(BSE)
Magnification: 8x~800000x
Electron Gun: Schottky Emission Electron Gun
Accelerating Voltage: 0~30KV
Max Specimen Diameter: 175mm
Specimen Stage: Five Axes Eucentric Motorized Stage
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    • Product Details
    • Company Profile

    Controled Mouse Scanning Electron Microscope Sem 8x~800000x Magnification

    • 8x~800000x With Detector SED+CCD, Five Axes Manual Stage or Motorized Stage
    • E-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low Voltage
    • Non Conduction Sample Can Be Observed Directly No Need To Be Sputtered In Low Voltage
    • Easy & Friendly Operation Interface, All Controled By Mouse In Windows System
    • Large Sample Room With Five Axes Eucentric Motorized Stage Large Size, Max Specimen Dia.175mm


    A63.7080, A63.7081 Software Main Function
    High voltage integrated commissioning Automatic filament on / off Potential shift regulation
    Brightness adjustment Electric to central adjustment Automatic brightness
    Contrast adjustment Objective lens adjustment Auto focus
    Magnification adjustment Objective degaussing Automatic astigmatism elimination
    Selected area scanning mode Electric rotation adjustment Management of microscope parameters
    Point scanning mode Electron beam displacement adjustment Real time display of scanning field size
    Line scanning mode Electron beam tilt adjustment Gun lens adjustment
    Surface scanning Scanning speed adjustment Multichannel input
    High voltage power monitoring Swing centering Ruler measurement
    SEM A63.7069 A63.7080 A63.7081
    Resolution 3nm@30KV(SE)
    6nm@30KV(BSE)
    1.5nm@30KV(SE)
    3nm@30KV(BSE)
    1.0nm@30KV(SE)
    3.0nm@1KV(SE)
    2.5nm@30KV(BSE)
    Magnification 8x~300000x Negative True Magnification 8x~800000x Negative True Magnification 6x~1000000x Negative True Magnification
    Electron Gun Pre-Centered Tungsten Filament Cartridge Schottky Field Emission Gun Schottky Field Emission Gun
    Voltage Accelerating Voltage 0~30KV, Continuous Adjustable, Adjust Step 100V@0-10Kv, 1KV@10-30KV
    Quick View One Key Quick View Image Function N/A N/A
    Lens System Three-levels Electromagnetic Tapered Lens Multi-levels Electromagnetic Tapered Lens
    Aperture 3 Molybdenum Objective Apertures, Adjustable Outside Of Vacuum System, No Need Disassemble Objective To Change Aperture
    Vacuum System 1 Turbo Molecular Pump
    1 Mechanical Pump
    Sample Room Vacuum>2.6E-3Pa
    Electron Gun Room Vacuum>2.6E-3Pa
    Fully Auto Vacuum Control
    Vacuum Interlock Function

    Optional Model: A63.7069-LV
    1 Turbo Molecular Pump
    2 Mechanical Pumps
    Sample Room Vacuum>2.6E-3Pa
    Electron Gun Room Vacuum>2.6E-3Pa
    Fully Auto Vacuum Control
    Vacuum Interlock Function

    Low Vacuum Range 10~270Pa For Quick Switch in 90 Seconds For BSE(LV)
    1 Ion Pump Set
    1 Turbo Molecular Pump
    1 Mechanical Pump
    Sample Room Vacuum>6E-4Pa
    Electron Gun Room Vacuum>2E-7 Pa
    Fully Auto Vacuum Control
    Vacuum Interlock Function
    1 Sputter Ion Pump
    1 Getter Ion Compound Pump
    1 Turbo Molecular Pump
    1 Mechanical Pump
    Sample Room Vacuum>6E-4Pa
    Electron Gun Room Vacuum>2E-7 Pa
    Fully Auto Vacuum Control
    Vacuum Interlock Function
    Detector SE: High Vacuum Secondary Electron Detector (With Detector Protection) SE: High Vacuum Secondary Electron Detector (With Detector Protection) SE: High Vacuum Secondary Electron Detector (With Detector Protection)
    BSE: Semiconductor 4 Segmentation
    Back Scattering Detector


    Optional Model: A63.7069-LV
    BSE(LV): Semiconductor 4 Segmentation
    Back Scattering Detector
    Optional Optional
    CCD: Infrared CCD Camera CCD: Infrared CCD Camera CCD: Infrared CCD Camera
    Extend Port 2 Extend Ports On Sample Room For
    EDS, BSD, WDS etc.
    4 Extend Ports On Sample Room For
    BSE, EDS, BSD, WDS etc.
    4 Extend Ports On Sample Room For
    BSE, EDS, BSD, WDS etc.
    Specimen Stage 5 Axes Stage, 4 Auto +1 Manual Control
    Travel Range:
    X=70mm, Y=50mm, Z=45mm,
    R=360°, T=-5°~+90°(Manual)
    Touch Alert & Stop Function
    5 Axes Auto Middle Stage
    Travel Range:
    X=80mm, Y=50mm, Z=30mm,
    R=360°, T=-5°~+70°
    Touch Alert & Stop Function

    Optional Model:

    A63.7080-M 5 Axes Manual Stage
    A63.7080-L 5 Axes Auto Large Stage
    5 Axes Auto Large Stage
    Travel Range:
    X=150mm, Y=150mm, Z=60mm,
    R=360°, T=-5°~+70°
    Touch Alert & Stop Function
    Max Specimen Dia.175mm, Height 35mm Dia.175mm, Height 20mm Dia.340mm, Height 50mm
    Image System Real Still Image Max Resolution 4096x4096 Pixels,
    Image File Format: BMP(Default), GIF, JPG, PNG, TIF
    Real Still Image Max Resolution 16384x16384 Pixels,
    Image File Format: TIF(Default), BMP, GIF, JPG, PNG
    Video: Auto Record Digital .AVI Video
    Real Still Image Max Resolution 16384x16384 Pixels,
    Image File Format: TIF(Default), BMP, GIF, JPG, PNG
    Video: Auto Record Digital .AVI Video
    Computer & Software PC Work Station Win 10 System, With Professional Image Analysis Software To Fully Control Whole SEM Microscope Operation, Computer Specification No Less Than Inter I5 3.2GHz, 4G Memory, 24" IPS LCD Monitor, 500G Hard Disk, Mouse, Keyboard
    Photo Display The Image Level Is Rich And Meticulous, Showing Real Time Magnification, Ruler, Voltage, Gray Curve
    Dimension
    & Weight
    Microscope Body 800x800x1850mm
    Working Table 1340x850x740mm
    Total Weight 400Kg
    Microscope Body 800x800x1480mm
    Working Table 1340x850x740mm
    Total Weight 450Kg
    Microscope Body 1000x1000x1730mm
    Working Table 1330x850x740mm
    Total Weight 550Kg
    Optional Accessories
    Optional Accessories A50.7002 EDS Energy Dispersive X-Ray Spectrometer
    A50.7011 Ion Sputtering Coater
    A50.7001 BSE Back Scattering Electron Detector
    A50.7002 EDS Energy Dispersive X-Ray Spectrometer
    A50.7011 Ion Sputtering Coater
    A50.7030 Motorize Control Panel
    A50.7001 BSE Back Scattering Electron Detector
    A50.7002 EDS Energy Dispersive X-Ray Spectrometer
    A50.7011 Ion Sputtering Coater
    A50.7030 Motorize Control Panel
    A50.7001 BSE Detector Semiconductor Four Segment Back Scattering Detector;
    Available In Ingredients A+B, Morphology Info A-B;
    Available Sample Observe Without Sputtering Gold;
    Available In Observe Impurity And Distribution From Grayscale Map Directly.
    A50.7002 EDS (X Ray Detector) Silicon Nitride (Si3N4) Window To Optimize Low Energy X-ray Transmission For Light Element Analysis;
    Excellent Resolution And Their Advanced Low-noise Electronics Provide Outstanding Throughput Performance;
    The Small Footprint Offers Flexibility To Ensure Ideal Geometry And Aata Collection Conditions;
    The Detectors Contain A 30mm2 Chip.
    A50.7003 EBSD (Electron Beam Backscattered Diffraction) user could analysis crystal orientation, crystal phase and micro texture of materials and related materials performance,etc.
    automatic optimization of EBSD camera settings
    during the data collection, do interactive real-time analysis to obtain maximum information
    all the data were branded with time tag, which can be viewed at any time
    high resolution 1392 x 1040 x 12
    Scanning and index speed: 198 points / sec, with Ni as the standard, under the condition of 2~5nA, it can ensure the index rate ≥99%;
    works well under the condition of low beam current and low voltage of 5kV at 100pA
    orientation measuring accuracy: Better than 0.1 degrees
    Using triplex index system: no need rely on single band definition , easy indexing of poor pattern quality
    dedicated database: EBSD special database obtained by electron diffraction: >400 phase structure
    Index ability: it can automatically index all crystal materials of 7 crystal systems.
    The advanced options include calculating elastic stiffness (Elastic Stiffness), Taylor (Taylor) factor, Schmidt (Schmid) factor and so on.
    A50.7010 Coating Machine Glass Protecting Shell: ∮250mm; 340mm High;
    Glass Processing Chamber:
    ∮88mm; 140mm High, ∮88mm; 57mm High;
    Specimen Stage Size: ∮40mm (max);
    Vacuum System:molecula Pump And Mechanical Pump;
    Vacuum Detection: Pirani Gage;
    Vacuum:better Than 2 X 10-3 Pa;
    Vacuum Protection:20 Pa With Microscale Inflation Valve;
    Specimen Movement: Plane Rotation,tilt Precession.
    A50.7011 Ion Sputtering Coater Glass Processing Chamber: ∮100mm; 130mm High;
    Specimen Stage Size: ∮40mm( Hold 6 Specimen Cups) ;
    Golden Target Size: ∮58mm*0.12mm(thickness);
    Vacuum Detection: Pirani Gage;
    Vacuum Protection:20 Pa With Microscale Inflation Valve;
    Medium Gas:argon Or Air With Argon Gas Special Air Inlet And Gas Regulating In Microscale.
    A50.7012 Argon Ion Sputtering Coater The Sample Was Plated With Carbon And Gold Under High Vacuum;
    Rotatable Sample Table, Uniform Coating, Particle Size About 3-5nm;
    No Selection Of Target Material, No Damage To Samples;
    The Functions Of Ion Cleaning And Ion Thinning Can Be Realized.
    A50.7013 Critical Point Dryer Inner Diameter: 82mm, Inner Length: 82mm;
    Pressure Range:0-2000psi;
    Temperature Range:0°-50° C (32°-122° F)
    A50.7014 Electron Beam Lithography Based On Scanning Electron Microscope, A Novel Nano-exposure System Was Developed;
    The Modificaton Has Kept All The Sem Functions For Making Nanoscale Line Width Image;
    The Modificated Ebl System Widly Applied Into Microelectronic Devices, Optoelectronic Devices, Quantun Devices, Microelectronics System R&d.
    A63.7080, A63.7081 Standard Consumables Outfit
    1 Field Emission Filament Installed In Microscope 1 Pc
    2 Sample Cup Dia.13mm 5 Pcs
    3 Sample Cup Dia.32mm 5 Pcs
    4 Carbon Double-sided Conductive Tape 6mm 1 Package
    5 Vacuum Grease   10 Pcs
    6 Hairless Cloth   1 Tube
    7 Polishing Paste   1 Pc
    8 Sample Box   2 Bags
    9 Cotton Swab   1 Pc
    10 Oil Mist Filter   1 Pc
    A63.7080, A63.7081 Standard Tools & Parts Outfit
    1 Inner Hexagon Spanner 1.5mm~10mm 1 Set
    2 Tweezers Length 100-120mm 1 Pc
    3 Slotted Screwdriver 2*50mm, 2*125mm 2 Pcs
    4 Cross Screwdriver 2*125mmm 1 Pc
    5 Clean vent pipe Dia.10/6.5mm(Out Diameter/Inner Diameter) 5m
    6 Vent pressure reducing valve Output Pressure 0-0.6MPa 1 Pc
    7 Internal baking power supply 0-3A DC 2 Pcs
    8 UPS power supply 10kVA 2 Pcs

    Quality Controled Mouse Scanning Electron Microscope Sem  8x~800000x Magnification for sale
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