ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd.
                                                                                                           
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SAW Grade Fe Doped LT Crystal Lithium Tantanlate Crystal

Price Negotiable
Price: USD 20-200/pc
MOQ: 1pc
Delivery Time: 3-5 weeks
Brand: Crystro
Product Description

SAW Grade Fe doped LT crystal Fe:LiTaO3 Lithium Tantanlate Wafer
 
Lithium tantalate (LiTaO3), has properties which make it useful for SAW (surface acoustic wave) devices and, to a different specification, for optical use. Wafers can be produced with varying properties, such as "black" wafers free of pyroelectric discharge, 4" (100mm), orientation 36°, 39°, 42 °, 46°, 48°, X-CUT detailed specifications, or with higher physical strength to withstand processing during manufacture, resulting in higher yields.
 
Crystro's Fe:LiTaO3  is grown by Czochralski method.Max diameter reach 6inch,can offer kinds of size per required.
Anhui Crystro participate in the kinds exhibitions every year: Laser World of Photonics Munich, Shanghai, Photonics West in San Francisco, CIOE in Shenzhen, etc.We looking forward to meet you.
 
 
Typical Specifications (for SAW use):
 

Orientation Diameter Reference Flat Perpendicular to Thickness Surface Finish
36° Y - Cut 76.2 ± 0.7 (mm) 22 ± 3 (mm) X 0.35 ± 0.03 (mm) Front Mirror Polished
42° Y - Cut X 0.50 ± 0.03 (mm)
X - Cut 100.0 ± 0.7 (mm) 32 ± 3 (mm) Parallel to 112.2° Y 0.50 ± 0.03 (mm) Back Ground

 
 Main 
Specifications:

 

Material LiTaO3 wafers(White or Black &Fe doped)
Curie Temp 603±2℃
Cutting Angle X/Y/Z/X112Y/Y36/Y42/Y48/etc
Diameter/size 2”/3”/4" LT wafer or other size
Tol(±) <0.20 mm
Thickness 0.18 ~ 0.5mm or more
Primary Flat 22mm /32mm /42.5mm /57.5mm
LTV (5mmx5mm) <1µm
TTV <3µm
Bow -30<bow<30
Warp <40µm
PLTV(<0.5um) ≥95%(5mm*5mm)
Orientation Flat All available
Surface Type Single Side Polished /Double Sides Polished
Polished side Ra <0.5nm
Back Side Criteria General is 0.2-0.5µm or as customized
Edge Criteria R=0.2mm or Bullnose
Fe doped Fe doped for saw grade LN< wafers
Wafer Surface Criteria Transmissivity general:5.9x10-11<s<2.0*10-10 at 25℃
Contamination, None
Particles ¢>0.3 µ m <= 30
Scratch , Chipping None
Defect No edge cracks, scratches, saw marks, stains

 

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Company ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd.
Location No. 176, Yuner Rd, Yunhai Rd Industrial Park,   Baohe District,Hefei City,Anhui Province
Contact Person Wu

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