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Non Destructive Testing Amorphous Silicon A Si

non destructive testing amorphous silicon a si

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139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing

Brand Name: HUATEC	Certification: CE ISO GOST
Model Number: H3543HWF-AG	Minimum Order Quantity: 1
Place of Origin: China	Packaging Details: export standard carton package
HUATEC GROUP CORPORATION [Beijing]
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H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel

Brand Name: HUATEC	Certification: CE
Model Number: H3543HWF-AG	Minimum Order Quantity: 1 pc
Delivery Time: 10-15 working days after receipt of your payment	Payment Terms: T/T,Paypal
HUATEC GROUP CORPORATION [Beijing,China]
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UNC Series NDT X-Ray Equipment DR with Amorphous Silicon Detector and 2600*2784*2440mm Footprint

Brand Name: UNICOMP	Certification: CE
Model Number: UNC320	Minimum Order Quantity: 1Set
Delivery Time: 10 days	Payment Terms: T/T, L/C
Unicomp Technology [Guangdong,China]
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