SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
                                                                                                           
Verified Supplier
33 Years
Since 1993
Menu

Piezoelectric Probe 3 Digital LCD Portable Roughness Tester For Laboratory

Price Negotiable
Price: Negotiable
MOQ: 1pc
Delivery Time: With one week after receiving payment
Brand: SADT
Product Description

Piezoelectric probe 3 digital LCD Portable metal Surface Roughness Tester with 7 type of probes for option

 

 

Pocket Surface roughness tester RoughScan

RoughScan of pocket Surface roughness tester is a portable, batterypowered instrument for checking surface roughness with the measured values displayed on a digital readout. The instrument can be used in the laboratory, an inspection area, in the shop, or wherever on-site surface roughness testing is required.

 

Specifications

Model SADT RoughScan
Measuring Range

Ra: 0.03μm~6.3μm/1μ”~250μ”

Rz/Ry/Rmax: 0.2μm~25μm/8μ”~999μ”

Resolution 0.01μm/1μ”
Cut-off 0.8mm/0.30”, ANSI 2RC Filter
Display 3-digit LCD
Readout Error ±10%
Stability ≤6%
Sensor Type Piezoelectric
Maximum stylus force 15.0mN/1500mgf
Working Environment 10oC~45oC
Storage Temperature 0oC~60oC

 

Traverse length Evaluation length Numbers of cutoff
0.5mm 0.25mm 1
1.2mm 0.8mm
5.5mm 5.0mm
1.25mm 0.75mm 2
3.0mm 2.4mm
5.5mm 5.0mm
1.75mm 1.25mm 3
4.5mm 4.0mm
5.5mm 5.0mm

 

Probe Application

Generalpurpose

probe SFP-2001 / SFP-2002

For most surface roughness applications. SFP-2001 has a 90° conical diamond stylus. 0004”/10μm radiusper ISOstandards.

SFP-2002 has a 90° conical diamond stylus. 0002”/ 5μm radius per DIN standards.

Transversechisel

probe SFP-2003

For gaging sharp edges or small O. D.’s where probe is aligned with (in 180° or closed position) to axis of traverse. 90° diamond chisel stylus, .0004”/ 10μm radius.
Parall elchisel probe SFP-2004 For gaging sharp edges or small O. D.’s where probe is perpendicular (in 90° or 270° position) to axis of traverse. 90° diamond chisel stylus. 0004”/ 10μm radius.
Small bore probe SFP-2005 / SFP-2006 For measurings mall bores (min. inside diameter of 5 . 0 mm , up to a depth of 15.0mm). 90° conical diamond stylus, .0004”/ 10μm radius for SFP-2005; 9 0° conical diamond stylus. 0002”/ 5μm radius for SFP-2006

Groove bottom

probe

For measuring the bottoms of “ O ” ring grooves , recesses and holes to depth of 6.0mm. Also used for short lands and shoulders. 90° conical diamond stylus, 0004”/10μm radius.

 

Standard package - RoughScan

RoughScan main unit 1

Standard probe 1

Calibrate plate with the refer[1]ence specimen 1

9-volt alkaline battery 1

Screw driver 1

Operation manual 1

Carrying case 1

 

Optional accessories

General Purpose Probe SFP-2001

General Purpose Probe SFP-2002

Transverse Chisel Probe SFP-2003

Parallel Chisel Probe SFP-2004

Small Bore Probe SFP-2005

Small Bore Probe SFP-2006

Groove bottom probe SFP-2007

Height Stand

Standard test block

 

Get in Touch

Have questions about our products or want to discuss a custom order? Our team is ready to help you.

Company SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Location Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Contact Person Hu

Request A Quote

Please check your email address.
Your message must be at least 20 characters.