Sireda Technology Co., Ltd.
                                                                                                           
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China 4-Wire Kelvin Test Socket for Low Resistance Testing with <10mΩ Contact Resistance and DC to 6GHz+ Frequency Range for sale

4-Wire Kelvin Test Socket for Low Resistance Testing with <10mΩ Contact Resistance and DC to 6GHz+ Frequency Range

Price Negotiable
Price: Get Quote
MOQ: 1
Delivery Time: Negotiable
Brand: Sireda
Product Description
4-Wire Kelvin Test Socket for Precision Low Resistance Testing
This advanced Kelvin test socket utilizes true 4-wire (4-point probe) technology to deliver exceptional measurement accuracy for semiconductor testing applications. Designed specifically for SOP, QFN, BGA, and advanced IC packages, it eliminates lead resistance errors that compromise traditional 2-terminal measurements.
Kelvin test socket front view showing precision contact points
Kelvin test socket side profile with measurement indicators
Close-up view of Kelvin test socket contact mechanism
Technical Advantages
Measurement Precision
True 4-wire Kelvin method eliminates lead resistance errors, providing
Reliability & Durability
Gold-plated spring probes ensure consistent performance and long service life. Self-cleaning contacts reduce maintenance requirements in high-volume production environments.
Custom Configuration
Modular design supports quick conversion between different DUT interfaces. Optimized for specific package types from SOP-8 to BGA-256+ and frequency ranges from DC to 6GHz+.
Operational Efficiency
Low-insertion-force (LIF) design prevents device damage during placement. Compatible with automated handlers for high-throughput production testing.
Adapter Module Components
Kelvin test socket bottom adapter module with contact array
Adapter Module (Bottom)
Kelvin test socket top adapter module with interface connections
Adapter Module (Top)
Application Specifications
Parameter Specification
Measurement Method 4-Wire Kelvin (4-Point Probe)
Contact Resistance <10mΩ
Package Compatibility SOP-8 to BGA-256+
Frequency Range DC to 6GHz+
Contact Material Gold-plated Spring Probes
Insertion Force Low-Insertion-Force (LIF) Design
Applications Semiconductor Validation, Quality Control, R&D
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Company Sireda Technology Co., Ltd.
Location Floor 6, Building 4, 10th Industry Park, GM Tianliao, Guangming New District, Shenzhen, PRC
Contact Person Wang

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