Truth Instruments Co., Ltd.
                                                                                                           
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250 nm Kerr Microscope High Resolution Magneto Optical Kerr Effect Microscope

Price Negotiable
Price: Price Negotiable | Contact us for a detailed quote
MOQ: Negotiable
Delivery Time: Negotiable
Brand: Truth Instruments
Product Description

Multifunctional Spin-Test Magneto-Optic Kerr Microscope

Product Model:

KMPL-S

Equipment Description:

This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and variable temperature modules. With a single button operation, it can observe magnetic dynamics under various excitation conditions, such as magnetic fields, currents, spin-orbit torque, and spin-transfer torque. It features microsecond-level fast-response magnetic fields for high-precision magnetic domain velocity and DMI measurements.

 

 
Equipment Performance
Optical Resolution: 250 nm
Objectives: 5x,20x,50x,100x,non-magnetic
In-Plane Magnetic Field: 1 T@air gap 5 mm; 0.5 T@air gap 10 mm; 0.3 T@air gap 16 mm
Vertical Magnetic Field: 0.25 T@single pole
Magnetic Field Resolution PID closed-loop feedback regulation, resolution 0.05 mT
Microsecond Ultrafast Pulse Vertical Magnetic Field 60 mT, rise time 0.5μs, pulse width l μs - 10 μs
Probe Station Compatible with 4-8 sets of non-magnetic probe holder
Elctrical Source Meter Keithley 6221, Keithley 2182A
Testing Functions Magnetic domain dynamic observation, global/micro-region hysteresis loop mapping based on Kerrsignals, domain wall velocity measurement, DMl measurement, anomalous Hall resistance, SOT switching, I-R hysteresis loop scanning with synchronized Kerr imaging, and curve mapping of Hallresistance changes in electronic devices under magnetic and current variations, along with corresponding Kerrimages

Magnetic Domain Distribution in Thin Films

MgO(substrate)/Co/PtSample**: Magnetic defects caused by lattice mismatch between MgO crystal substrate and Co.

 

Poor-Quality Magnetic Films**:Snowflake-like magnetic domains during magneti creversal.

 

High-Quality Magnetic Films**Uniform magnetic domain structures with smooth edges.

 

 

Characterization of local magnetic intrinsic parameters

 

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Company Truth Instruments Co., Ltd.
Location 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China
Contact Person Alex TANG

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