atomic force microscope for nanometer imaging

...Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force...

... force microscope imaging functions, both of which can work at the same time without affecting each other ◆ At the same time, it has the functions of optical 2D measurement and atomic force microscope 3D measurement ◆ The laser detection head and the

... the upper limit of new discoveries. Equipment such as scanning electron microscopes (SEM), atomic force microscopes (AFM), lithography machines, and gravitational wave detection devices are sensitive to environmental vibrations at the nanometer or