Accessibility Test Probes,Test Fingers and Test Pins
IEC61032 IEC60529 IP1X Test Probe A with 50N thrust
IEC60529 IP1X Test Probe A with 50N thrustArticle NO.: BND-ASpecification:IP1X Probe A /Test Probe A1, According to : IEC61032:1997 /IEC60529:2001 and UL2, IP1X Probe A (Test Probe A) is necessary appliance for domestic and similar electrical appliance of against electric shock protection test.Technical Parameters:1, Ball Diameter: 50mm2, Baffle Plate Diameter: 45mm3, Baffle Plate Thickness:4mm4, Handle Diameter: 10mm5, Handle Length :100mm6, According to IEC61032 figure 1
IEC61032 IEC60529 IP1X Test Probe A
IEC60529 IP1X Test Probe AArticle NO.: BND-ASpecification:IP1X Probe A /Test Probe A1, According to : IEC61032:1997 /IEC60529:2001 and UL2, IP1X Probe A (Test Probe A) is necessary appliance for domestic and similar electrical appliance of against electric shock protection test.Technical Parameters:1, Ball Diameter: 50mm2, Baffle Plate Diameter: 45mm3, Baffle Plate Thickness:4mm4, Handle Diameter: 10mm5, Handle Length :100mm6, According to IEC61032 figure 1 (the Test probe A)
IEC61032 IEC60529 IP2X Test Probe B Test Finger
IEC61032 IEC60529 IP2X Test Probe B Test FingerArticle NO.: BND-BSpecification:The Standard Test Finger Probe / The Standard Test Knurled Finger Probe / Test Probe B / IP2X Protection Grade ProbeTechnical Parameters:1, Knurled Finger Diameter:12mm2, Knurled Finger Length :80mm3, Baffle Plate Diameter :50mm4, Baffle Plate Length : 100mm5According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1Application:1.The joint parts of the test finger