Fiber Optic Spectrometer

CCD Optical Fiber Spectrometer Advanced Technology For Spectral Analysis Key Specifications Applications Absorption, transmittance and reflectance detection, Light source and laser wavelength detection, OEM product module: Fluorescence spectrum analysis, Raman spectroscopy - petrochemical monitoring, food additive testing Focal Length ≤100mm Entrance Slit Width 10μm, 25μm, 50μm, 100μm, 200μm Spectrometer Type SR100Q CCD Fiber Optic Spectrometer Data output interface USB3.0,

Signal-To-Noise Ratio CCD Fiber Spectrometer - Scientific Grade Low Noise Key Features Scientific-grade CCD spectrometer with high signal-to-noise ratio (SNR up to 1000:1) Area array back-illuminated refrigeration chip (Hamamatsu S7031) Ultra-low dark noise under long integration time Compact dimensions (180×120×50 mm) and lightweight (1200g) High-speed USB 2.0 interface for easy connectivity 92% peak quantum efficiency @650nm, 83%@232nm Technical Specifications Attribute

SR100Q Ultra High Sensitivity Fiber Optic Spectrometer Product Overview The JINSP SR100Q spectrometer integrates the Hamamatsu S7031 scientific-grade TE-cooled area array CCD chip. With 24×24μm pixel size and up to 92% quantum efficiency, it delivers exceptional UV band response, significantly enhancing sensitivity and SNR for weak signals. The advanced optical path design combined with low-noise, high-speed FPGA signal processing ensures stable, reliable performance and

Research Grade SR100Q CCD Fiber Optic Spectrometer Key Features High signal-to-noise ratio with ultra-low dark noise Scientific-grade TE-cooled area array CCD chip (Hamamatsu S7031) Excellent quantum efficiency (92% peak @650nm, 83%@232nm) Noise-free processing of weak signals in long exposure Low-noise, high-speed USB3.0 circuit Multiple entrance slit width options (10μm to 200μm) Technical Specifications Attribute Value Weight 1200g Chip Type Area array back-illuminated

TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectral Range 200nm-1100nm Key Specifications Spectral Range 200nm - 1100nm Effective pixels 1024×122 Quantum Efficiency QE92% peak @650nm, 83%@232nm SNR 1000:1 92% High Quantum Efficiency Spectrometer for Film Thickness Measurement The widespread use of thin films in high-tech industries requires advanced thickness assessment methods. Our photoelectric technology provides non-invasive

92% High Quantum Spectrometer for Film Thickness Measurement Key Specifications Spectral Range: 200nm - 1100nm Effective pixels: 1024*122 Quantum Efficiency: QE92%peak@650nm, 83%@232nm SNR: 1000:1 Product Overview Thin film technology plays a vital role across industries like semiconductors, solar energy, displays, and optical coatings. Our high quantum efficiency spectrometer provides precise, non-contact thickness measurement for analyzing surface morphology, combining

100mm Focal Length Fiber Optic Spectrometer with USB 3.0 Connectivity and Active Cooling System Product Specifications Spectral Range 200nm - 1100nm Effective pixels 2048*64 Pixel Size 28.672*0.896mm Fiber Interface SMA905, free space Numerical Aperture 0.13 Focal Length 100mm Dimensions 180mm*120mm*50mm Weight 1.2kg UV-VIS 200nm-1100nm Wide Wavelength Range Fiber Optic Spectrometer Engineered for photon-starved applications, the SR100Z detects what others miss. Its cooled

Advanced Fiber Optic Spectrometer for Industrial and Scientific Integration Time 4ms-900s Spectral Range 200nm 1100nm Product Specifications Attribute Value Spectral Range 200nm - 1100nm Effective pixels 2048*64 Pixel Size 28.672*0.896mm Integration Time 4ms~900s Dimensions 180mm*120mm*50mm Weight 1.2kg Product Description Backlit Array CCD UV Enhanced High Sensitivity Modular Spectrometer The SR100B spectrometer is engineered for excellence in spectral analysis, featuring a

Customizable Back-illuminated CCD Fiber Optic Spectrometer with High Sensitivity and Resolution Key Specifications Attribute Value Spectral Range 200nm - 1100nm Effective pixels 2048*64 Pixel Size 28.672*0.896mm Integration Time 4ms~900s Dimensions 180mm*120mm*50mm Weight 1.2kg Product Overview The SR100B spectrometer is a high-performance spectral analysis instrument featuring a back-illuminated CCD sensor with exceptional capabilities. Designed for industrial, laboratory,

Spectrual Range 200nm-1100nm Fiber Optic Spectrometer for Film Thickness Measurement Key Specifications Attribute Value Spectrual Range 200nm - 1100nm Effective pixels 1024*122 Quantum Efficiency QE92%peak@650nm, 83%@232nm SNR 1000:1 High Performance Spectrometer for Precision Film Thickness Measurement As thin films become essential components in optoelectronics and energy devices, accurate thickness measurement is critical. Our photoelectric solutions provide non-contact

Fiber Optic Spectrometer for Accurate and Sensitive Data in Wide Wavelength Range 2048x64 Pixel Array | 14x14 μm Pixel Size | 1.2kg | Integration Time 4ms-900s Key Specifications Attribute Value Spectral Range 200nm - 1100nm Effective pixels 2048*64 Pixel Size 28.672*0.896mm Integration Time 4ms~900s Dimensions 180mm*120mm*50mm Weight 1.2kg Backlit Array CCD UV Enhanced High Sensitivity Modular Spectrometer The SR100B spectrometer represents a pinnacle of technological

200nm-1100nm Fiber Optic Spectrometer The Perfect Tool for Scientific and Industrial Applications Product Overview The SR100B spectrometer is a high-performance device designed for industrial, laboratory, and research environments. Featuring the Hamamatsu S10420 CCD chip, it offers exceptional spectral analysis capabilities with stable and consistent readings. Key Specifications Attribute Value Spectral Range 200nm - 1100nm Effective pixels 2048*64 Pixel Size 28.672*0.896mm