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HYX-3 Single Phase X-Ray Crystal Orientation Indicator for 6-8 Inch Silicon Rods with ±30″ Precision

Price Negotiable
Price: Negotiable
MOQ: 1pcs
Delivery Time: 1-4days
Brand: HUATEC
Product Description
HYX-3 X-Ray Crystal Orientation Indicator
The HYX-3 X-ray crystal orientation indicator instrument provides precise crystal orientation measurement for semiconductor and crystal processing applications, ensuring accurate alignment before and after manufacturing processes.
Primary Applications
This equipment performs critical orientation functions for seed crystals both before and after processing operations, supporting various crystal materials including silicon rods and sapphire.
Standard Configuration Features
  • Dual-side orientation capability with specialized fixtures
  • Crystal face measurement for 111, 110, 100 crystal directions in silicon rods
  • Sapphire crystal orientation for A, C, R directions
  • Measurement range: φ 2-8 inches for crystal rods
  • Compatible with HTJ-08 cutting machines, surface grinding machines, and single line cutting machines
Seed Crystal Testing Capabilities
  • Round seed crystals: Φ5-20mm diameter
  • Square seed crystals: Φ5-20mm dimensions
  • Maximum crystal length: 150mm (extendable to 180mm)
Technical Specifications
Parameter Specification
Crystal Bar Diameter 6-8 inches
Crystal Bar Length 150mm (maximum 180mm)
Seed Crystal Diameter Φ5-20mm
Seed Crystal Length 150mm (maximum 180mm)
Clamp Diameter 260mm
Testing Crystal Faces 111, 100
Indication Precision ±30″
Digital Display θ: degree; minute; second; minimum value of 10″
Technical Standards Meets HYX-2 performance targets
Key Performance Advantages
High-precision orientation with ±30″ accuracy, compatible with multiple processing equipment types, and supports both pre-processing and post-processing crystal alignment verification.

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Company HUATEC GROUP CORPORATION
Location 7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096
Contact Person JingAn Chen

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