Hartip3210 Leeb Digital Hardness Tester 25000 Data Memory 1 Year Warranty
Price:
USD400-1000/Pcs
MOQ:
1 pc
Delivery Time:
3 days upon advanced payment
Brand:
SADT
Product Description
Hartip3210 Leeb Portable Digital Hardness Tester which can be equipped with both cable probe and wireless probe
Product Description
HARTIP 3210 is a new generation of Leeb hardness tester with more advanced technology and features.
The tester applies our new patent technology which makes the tester more accurate than old previous model. All impatct device (probe) are no need to setup impact direction. HARTIP 3210 can work with both analogy impact device and wireless RF probe.
The measuring values can be downloaded to PC and printer by wireless or by cable.
The HARTIP 3210 also can be powered by USB power supply without battery via PC cable.
Advantages:
Wireless digital / cable analogue compatible
No need to setup different impact direction
Higher accuracy at +/-2 HLD
TFT large color LCD with pixel 320 x 240
Multi color style - fittable under sunshine
Multi display mode - statistics, bar graph, etc.
Multi save mode for data
Multi statistics calculation
Print online and screen copy printout
Sound reminder
Real date and time
Recalibration for unified or individual scale
Operator, part no., procedure no. record
Specifications:
SADT HARTIP 3210 |
|
| Principle | Leeb hardness measurement |
| Accuracy | ±0.3% @ HL=800, Repeatability: ±2HL |
| Display | 2.8" 320 x 240 TFT color LCD - fittable under sunshine |
| Hardness scale | HL / HRC / HRB / HB / HV / HS / HRA /σb |
| Measuring range | HL170-960 / HRC1.3-78.2 / HRB1.2-139.7 / HB28-1027 / HV45-1221 / HS4.0-112.1 / HRA1.3-88.5 / σb(rm)118-3315N/mm2 |
Impact device |
r/f wireless probe D / standard cable probe D DC / D+15 / C / G / E / DL (Optional) |
r/f communication distance |
10m in space |
| r/f frequency | 2.4GHz |
| Impact direction | Universal angle type |
| Materials and curves | 11 common metal materials, 60 conversion curves |
| Memory | 25000 data |
| Statistics | Single group analysis -- mean, max., min., extreme deviation, standard deviation, coefficient of kurtosis, coefficient of skewness, percent of pass, column diagram, normality distribution test and uniform distribution test Double group analysis-- significant difference test for mean value, standard deviation, percent of pass and distribution |
Re-calibration |
Calibration for unified or individual scale |
| Indicator | Upper limit / Lower limit / low battery / buzzer warning / date and time |
| Communication interface | 2.4G wireless / USB / RS232 / Bluetooth(optional) |
| Continous working time | >40 hours |
| Power supply | 1.5V AA alkaline battery x 4 / 1.2V nickel-hydrogen rechargerable battery x 4 / 3.7VLi-ion rechargeable battery x 4 / USB power supply |
| Working environment | -10°c~+45°c |
Dimension (mm) |
195 x 84 x 38 |
| Net weight (g) | 550 |
| Standards | Conforming to ASTM A956, DIN 50156, GB/T 17394-1998 |
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Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.
Company
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Location
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Contact Person
Hu