SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
                                                                                                           
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Since 1993
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Bluetooth Leeb 2.8" Display 3100 Data Digital Hardness Tester

Price Negotiable
Price: Negotiable
MOQ: 1
Delivery Time: Within 3 days after receiving payment
Brand: SADT
Product Description

 

HARTIP 3000+ is a new generation of Leeb hardness tester with more advanced technology and features. The tester applies our new patent sensor technology which makes the tester more accurate than old previous model. All impact devices (probes) do not need to set up impact direction. HARTIP 3000+ works with digital impact device. The measuring values can be downloaded to PC and printer by wireless or by cable. The HARTIP 3000+ also can be powered by USB power supply without battery via PC cable.

 

 

Specifications:

HARTIP3000+      
Principle Leeb Hardness Measurement Memory 31 Files, 100 Data For Each File, Can Be Saved And Re-Readable
Accuracy ±0.3% @ HL=800, Repeatability: ±2HL Statistics Various Statistical Analysis
Display 2.8” 320 X 240 TFT Color LCD - Fittable Under Sunshine Re-Calibration Allowed By User

 

Hardness Scale

HL / HRC / HRB / HB / HV / HS / HRA

/ MPa

 

Indicator

Upper Limit / Lower Limit / Low Battery / Buzzer Warning / Date And Time

 

Measuring Range

HL100-960 / HRC0.9-79.2 / HRB1.0-140

/ HB1-1878 / HV1-1698 / HS0.5-1370 / HRA1.0-88.5 / MPa(Rm)1-6599N/Mm2

 

Display Resolution

 

1HL, 0.1HRC

Digital Probe DC / D+15 / C / G / E / DL (Optional) Communication Interface

USB / RS232

Bluetooth (Optional)

Impact Direction Universal Angle Type Continous Working Time >40 Hours
Materials And Conversion Curves 12 Common Metal Materials, 75 Conver- Sion Curves

 

Power Supply

1.5V AA Alkaline Battery X 4 / 1.2V Nickel-Hydrogen Rechargerable Bat- Tery X 4 / USB Power Supply
Working Environment -10ºC~+45ºC Dimension (Mm) 195 X 84 X 38
Net Weight (G) 550 Standards ASTM A956, DIN 50156, EN ISO 16859, GB/T 17394-1998

 

Portable Hardness Tester

●Standard package HARTIP 3000+ main unit 1

●Digital probe D 1

●Small support ring 1

●Test block D 1 Cleaning brush 1

●USB cable 1

●PC software 1

●Operation manual 1

●Test Certificate 1

●Carrying case 1

 

  1. Special Features of Impact Devices
    Type Brief description
    D

    Universal standard unit for majority of hardness testing

    assignments.

    DC Extremely short impact device, other specs identical with type D.
    Application: - highly confined spaces
      - holes and cylinders
      - internal measurements on assembled machines
    D+15 Slim front section
      Application: - grooves and recessed surfaces.
    DL Extremely slim front section
    Application: - extremely confined spaces
      - base of grooves
    C Reduced impact energy ( compared with type D).
    Application: - surface hardened components, coatings
      - minimum layer thickness: 0.2mm.
      - thin walled or impact sensitive components (small measuring indentation).
    E Synthetic diamond test tip (approx.5000 HV).
      Application: - extremely high hardness measurement such as high carbon steel up to 1200 HV
    G Increased impact energy(approx. 9 times that of type D)
      Application: - Brinell hardness range only
        - heavy cast and forged parts with lower demands on surface finish.

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Have questions about our products or want to discuss a custom order? Our team is ready to help you.

Company SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Location Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Contact Person Hu

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