SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
                                                                                                           
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Wireless Probe Dl D E Metal Hardness Tester For Petroleum Chemistry

Price Negotiable
Price: Negotiable
MOQ: 1 pcs
Delivery Time: 5-8 work days
Brand: SADT
Product Description

 

Impact device/Probe for IMPACT DEVICE

Leeb hardness tester

 

Various impact devices includes analog impact device, digital impact device, wireless impact device, universal impact device and unique reading probe, they are designed for Leeb hardness testers, which make the testers suitable for testing the hardness of all metals. They are widely used in the industry of power, petro chemistry, air space, vehicle, machine and so on.

 

Specifications

Impact Device (Probe) Description
D Universal standard unit for majority of hardness testing assignments.
DC Extremely short impact device, other specs identical with type D.
Application: Highly confined spaces.
Holes and cylinders.
Internal measurements on assembled machines
D+15 Slim front section
Application: Grooves and recessed surfaces
DL Extremely slim front section.
Application: Extremely confined spaces
Base of grooves
C Reduced impact energy (compared with type D)

Application:

 

Surface hardened components, coatings
Minimum layer thickness: 0.2mm
Thin walled or impact sensitive components (small measuring indentation)
E Synthetic diamond test tip (approx.5000 HV)
Application: Extremely high hardness measurement such as high carbon steel up to 1200 HV
G Enlarged test tip, increased impact energy(approx. 9 times that of type D)
Application: Brinell hardness range only
Heavy cast and forged parts with lower demands on surface finish

 

Meaning of Various Symbols Symbol Meaning
Leeb hardness value obtained with impact device D          HLD
Leeb hardness value obtained with impact device DC       HLDC
Leeb hardness value obtained with impact device G         HLG
Leeb hardness value obtained with impact device C         HLC
Leeb hardness value obtained with impact device D+15   HLD+15
Leeb hardness value obtained with impact device E          HLE
Leeb hardness value obtained with impact device DL        HLDL

 

 

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Company SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Location Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Contact Person Hu

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