Opto Edu A62.4503 Atomic Force Microscope with 50μm Scan Range 0.2nm Resolution and 0.6Hz~4.34Hz Scan Rate for Laboratory Research
Price:
FOB $1~1000, Depend on Order Quantity
MOQ:
1 pc
Delivery Time:
5~20 Days
Brand:
CNOEC, OPTO-EDU
Product Description
Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory
Key Features
- Basic Level, Separate Controller & Main Body Design
- Contact Mode and Tapping Mode operation
- Scan Range: XY 50×50μm, Z 5μm
- Scan Resolution: XY 0.2nm, Z 0.05nm
- Sample Size: Diameter <90mm, Height <20mm
- Stage Moving: 25×25mm
- Optical Objective: APO 10x with 1μm resolution
- Scan Speed: 0.6~30Hz
- Scan Angle: 0-360°
- Output: USB3.0 compatible with Win7/8/10/11
- Optional Work Modes: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
Integrated laser detection head and sample scanning stage for stable structure and strong anti-interference
Precision probe positioning device with easy laser spot alignment adjustment
Single-axis drive sample automatically approaches probe vertically for perpendicular needle tip alignment
Motor-controlled pressurized piezoelectric ceramic automatic detection protects probe and sample
High-precision, wide-ranging piezoelectric ceramic scanners available
High-magnification objective lens with automatic optical positioning for real-time observation
Spring suspension shockproof method for effective vibration damping
Metal shielded soundproof box with built-in temperature and humidity sensor
Integrated scanner nonlinear correction editor with nanometer characterization accuracy better than 98%
Technical Specifications
| Specification | A62.4500 | A62.4501 | A62.4503 | A62.4505 |
|---|---|---|---|---|
| Work Mode | Tapping Mode 【Optional】 Contact Mode, Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode | Contact Mode, Tapping Mode 【Optional】 Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode | Contact Mode, Tapping Mode 【Optional】 Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode | Contact Mode, Tapping Mode 【Optional】 Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode |
| Current Spectrum Curve | RMS-Z Curve 【Optional】 F-Z Force Curve | RMS-Z Curve, F-Z Force Curve | RMS-Z Curve, F-Z Force Curve | RMS-Z Curve, F-Z Force Curve |
| XY Scan Range | 20×20μm | 20×20μm | 50×50μm | 50×50μm |
| XY Scan Resolution | 0.2nm | 0.2nm | 0.2nm | 0.2nm |
| Z Scan Range | 2.5μm | 2.5μm | 5μm | 5μm |
| Y Scan Resolution | 0.05nm | 0.05nm | 0.05nm | 0.05nm |
| Scan Speed | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz |
| Scan Angle | 0~360° | 0~360° | 0~360° | 0~360° |
| Sample Size | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm |
| XY Stage Moving | 15×15mm | 15×15mm | 25×25μm | 25×25μm |
| Shock-Absorbing Design | Spring Suspension | Spring Suspension, Metal Shielding Box | Spring Suspension, Metal Shielding Box | - |
| Optical System | 4x Objective Resolution 2.5μm | 4x Objective Resolution 2.5μm | 4x Objective Resolution 2.5μm | Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing |
| Output | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 |
| Software | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 |
Microscope Comparison
| Resolution | Working Condition | Working Temperature | Damage to Sample | Inspection Depth |
|---|---|---|---|---|
| SPM Atom Level 0.1nm | Normal, Liquid, Vacuum | Room or Low Temperature | None | 1~2 Atom Level |
| TEM Point 0.3~0.5nm Lattice 0.1~0.2nm | High Vacuum | Room Temperature | Small | Usually <100nm |
| SEM 6-10nm | High Vacuum | Room Temperature | Small | 10mm @10x 1μm @10000x |
| FIM Atom Level 0.1nm | Super High Vacuum | 30~80K | Damage | Atom Thickness |
| Microscope | Optical Microscope | Electron Microscope | Scanning Probe Microscope |
|---|---|---|---|
| Max Resolution (μm) | 0.18 | 0.00011 | 0.00008 |
| Remark | Oil immersion 1500x | Imaging diamond carbon atoms | Imaging high-order graphitic carbon atoms |
| Image |  |  |  |
| Probe-Sample Interaction | Measure Signal | Information |
|---|---|---|
| Force | Electrostatic Force | Shape |
| Tunnel Current | Current | Shape, Conductivity |
| Magnetic Force | Phase | Magnetic Structure |
| Electrostatic Force | Phase | charge distribution |
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Company
Opto-Edu (Beijing) Co., Ltd.
Location
F-1501 Wanda Plaza, No. 18 Shijingshan Road, Beijing 100043, China
Contact Person
Huang Xin