Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

Name: Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20u00d720um XY Scan Resolution 0.2nm Z Scan Range 2.5um
Brand: Opto-Edu (Beijing) Co., Ltd.

Price Negotiable

Price: FOB $1~1000, Depend on Order Quantity

MOQ: 1pc

Delivery Time: 5~20 Days

Brand: OPTO-EDU

Product Description

Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force

Product Overview

Basic Level system with separate controller and main body design
Supports Contact Mode and Tapping Mode operation
XY Scan Range: 20×20μm with 0.2nm resolution
Z Scan Range: 2.5μm with 0.05nm resolution
Sample Size: Diameter <90mm, Height <20mm
Stage Movement: 15×15mm
Optical Objective: APO 4x with 2.5μm resolution
Scan Speed: 0.6~30Hz with 0-360° scan angle
Output: USB3.0 compatible with Windows 7/8/10/11
Optional Work Modes: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode

Opto Edu A62.4501 Scanning Microscope overview

Close-up of laser detection head and sample scanning stage

Key Features

The laser detection head and sample scanning stage are integrated for maximum stability and interference resistance

Precision probe positioning device for easy laser spot alignment adjustment
Single-axis drive sample automatically approaches probe vertically for perpendicular needle tip alignment
Motor-controlled pressurized piezoelectric ceramic automatic detection protects both probe and sample
High-precision, wide-range piezoelectric ceramic scanners available for selection
High-magnification objective lens with automatic optical positioning - no focusing required
Spring suspension shockproof design provides excellent vibration damping
Metal shielded soundproof box with built-in temperature and humidity sensors
Integrated scanner nonlinear correction user editor with nanometer characterization accuracy better than 98%

Technical Specifications

Specification	A62.4500	A62.4501	A62.4503	A62.4505
Work Mode	Tapping Mode 【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode
Current Spectrum Curve	RMS-Z Curve 【Optional】 F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve
XY Scan Range	20×20μm	20×20μm	50×50μm	50×50μm
XY Scan Resolution	0.2nm	0.2nm	0.2nm	0.2nm
Z Scan Range	2.5μm	2.5μm	5μm	5μm
Y Scan Resolution	0.05nm	0.05nm	0.05nm	0.05nm
Scan Speed	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz
Scan Angle	0~360°	0~360°	0~360°	0~360°
Sample Size	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm
XY Stage Moving	15×15mm	15×15mm	25×25μm	25×25μm
Shock-Absorbing Design	Spring Suspension	Spring Suspension Metal Shielding Box	Spring Suspension Metal Shielding Box	-
Optical System	4x Objective Resolution 2.5μm	4x Objective Resolution 2.5μm	4x Objective Resolution 2.5μm	Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing
Output	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0
Software	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10

Microscope Technology Comparison

Resolution	Working Condition	Working Temperature	Damage to Sample	Inspection Depth
SPM Atom Level 0.1nm	Normal, Liquid, Vacuum	Room or Low Temperature	None	1~2 Atom Level
TEM Point 0.3~0.5nm Lattice 0.1~0.2nm	High Vacuum	Room Temperature	Small	Usually <100nm
SEM 6-10nm	High Vacuum	Room Temperature	Small	10mm @10x 1μm @10000x
FIM Atom Level 0.1nm	Super High Vacuum	30~80K	Damage	Atom Thickness