Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

Price Negotiable

Price: FOB $1~1000, Depend on Order Quantity

MOQ: 1pc

Delivery Time: 5~20 Days

Brand: OPTO-EDU

Product Description

Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle

The Opto Edu A62.4503 Atomic Force Microscope offers advanced research capabilities with 360° scan angle, featuring both Contact Mode and Tapping Mode operation. With exceptional scan resolution (XY 0.2nm, Z 0.05nm) and a wide scan range (XY 50×50μm, Z 5μm), this instrument delivers precise nanometer-scale measurements for demanding research applications.

Opto Edu A62.4503 Atomic Force Microscope main unit

Close-up view of microscope scanning mechanism

Key Features

Integrated laser detection head and sample scanning stage for maximum stability and interference resistance
Precision probe positioning device with easy laser spot alignment adjustment
Single-axis drive sample automatically approaches probe vertically for optimal alignment
Motor-controlled pressurized piezoelectric ceramic automatic detection for safe needle feeding
High-precision, wide-range piezoelectric ceramic scanners available for selection
High-magnification objective lens with automatic optical positioning for real-time observation
Spring suspension shockproof system for effective vibration damping
Metal shielded soundproof box with built-in temperature and humidity monitoring
Integrated scanner nonlinear correction editor with >98% measurement accuracy

Microscope control interface and components

Detailed view of microscope probe mechanism

Technical Specifications

Specification	A62.4500	A62.4501	A62.4503	A62.4505
Work Mode	Tapping Mode 【Optional】Contact Mode, Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode	Contact Mode, Tapping Mode 【Optional】Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode	Contact Mode, Tapping Mode 【Optional】Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode	Contact Mode, Tapping Mode 【Optional】Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
Current Spectrum Curve	RMS-Z Curve 【Optional】F-Z Force Curve	RMS-Z Curve, F-Z Force Curve	RMS-Z Curve, F-Z Force Curve	RMS-Z Curve, F-Z Force Curve
XY Scan Range	20×20μm	20×20μm	50×50μm	50×50μm
XY Scan Resolution	0.2nm	0.2nm	0.2nm	0.2nm
Z Scan Range	2.5μm	2.5μm	5μm	5μm
Y Scan Resolution	0.05nm	0.05nm	0.05nm	0.05nm
Scan Speed	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz
Scan Angle	0~360°	0~360°	0~360°	0~360°
Sample Size	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm
XY Stage Moving	15×15mm	15×15mm	25×25μm	25×25μm
Shock-Absorbing Design	Spring Suspension	Spring Suspension, Metal Shielding Box	Spring Suspension, Metal Shielding Box	-
Optical System	4x Objective, Resolution 2.5μm	4x Objective, Resolution 2.5μm	4x Objective, Resolution 2.5μm	Eyepiece 10x, Infinity Plan LWD APO 5x10x20x50x, 5.0M Digital Camera, 10" LCD Monitor, With Measuring, LED Kohler Illumination, Coaxial Coarse & Fine Focusing
Output	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0
Software	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10

Microscope Technology Comparison

Resolution	Working Condition	Working Temperature	Damage to Sample	Inspection Depth
SPM	Atom Level 0.1nm	Normal, Liquid, Vacuum	Room or Low Temperature	None	1~2 Atom Level
TEM	Point 0.3-0.5nm, Lattice 0.1-0.2nm	High Vacuum	Room Temperature	Small	Usually <100nm
SEM	6-10nm	High Vacuum	Room Temperature	Small	10mm @10x, 1μm @10000x
FIM	Atom Level 0.1nm	Super High Vacuum	30-80K	Damage	Atom Thickness