Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range

Name: Opto Edu A62.4505 All-in-One Microscope with 50u00d750um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range
Brand: Opto-Edu (Beijing) Co., Ltd.

Price Negotiable

Price: FOB $1~1000, Depend on Order Quantity

MOQ: 1pc

Delivery Time: 5~20 Days

Brand: OPTO-EDU

Product Description

Opto Edu A62.4505 Scanning Optical Microscope All In One

Optical + Atomic Force Microscope, All-in-One

Integrated design of optical metallographic microscope and atomic force microscope with powerful functions
Combines optical microscope and atomic force microscope imaging functions that can work simultaneously without interference
Features both optical 2D measurement and atomic force microscope 3D measurement capabilities
Laser detection head and sample scanning stage are integrated for stable structure and strong anti-interference
Precision probe positioning device with easy laser spot alignment adjustment
Single-axis drive sample automatically approaches the probe vertically for perpendicular needle tip positioning
Motor-controlled pressurized piezoelectric ceramic automatic detection protects both probe and sample
Ultra-high magnification optical positioning system for precise probe and sample scanning area positioning
Integrated scanner nonlinear correction user editor

Specifications

Specification	A62.4500	A622.4501	A62.4503	A62.4505
Work Mode	Tapping Mode 【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode Current Spectrum Curve
Output	RMS-Z Curve 【Optional】 F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve
XY Scan Range	20×20um	20×20um	50×50um	50×50um
XY Scan Resolution	0.2nm	0.2nm	0.2nm	0.2nm
Z Scan Range	2.5um	2.5um	5um	5um
Y Scan Resolution	0.05nm	0.05nm	0.05nm	0.05nm
Scan Speed	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz
Scan Angle	0~360°	0~360°	0~360°	0~360°
Sample Size	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm
XY Stage Moving	15×15mm	15×15mm	25×25um	25×25um
Shock-Absorbing Design	Spring Suspension	Spring Suspension Metal Shielding Box	Spring Suspension Metal Shielding Box	-
Optical System	4x Objective Resolution 2.5um	4x Objective Resolution 2.5um	4x Objective Resolution 2.5um	Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing
Output	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0
Software	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10

Microscope Comparison

Microscope	Optical Microscope	Electron Microscope	Scanning Probe Microscope
Max Resolution (um)	0.18	0.00011	0.00008
Remark	Oil immersion 1500x	Imaging diamond carbon atoms	Imaging high-order graphitic carbon atoms
Image

Probe-Sample Interaction

Force	Measure Signal	Information
Electrostatic Force	Phase	charge distribution
Tunnel Current	Current	Shape, Conductivity
Magnetic Force	Phase	Magnetic Structure

Technical Specifications Comparison

	Resolution	Working Condition	Working Temperature	Damage to Sample	Inspection Depth
SPM	Atom Level 0.1nm	Normal, Liquid, Vacuum	Room or Low Temperature	None	1~2 Atom Level
SEM	6-10nm	High Vacuum	Room Temperature	Small	10mm @10x 1um @10000x
FIM	Atom Level 0.1nm	Super High Vacuum	30~80K	Damage	Atom Thickness