155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors
Climatic Halt /Hast Aging Test Chamber For Ic Semiconductors
Volume and dimension
| 2.1 Volume | About 155L |
| 2.2 Interior size | Ø550 mm*D650mm(Drum type pressure inner box) |
| 2.3 Exterior size |
W900 mm*H1552mm*D1500 mm(Excluding the protruding part of the machine!) Tips: For external dimensions, please confirm the three views according to the final design! |
3. The main technical parameters
| 3.1 Test Conditions |
Cool method: :Natural cooling or air purging Measured at a room temperature of +25 ℃ under no load, Measured at normal pressure 101.3Kpa, the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5 or IEC60068 -3; the sensor is placed at the air outlet of the air handling unit. |
| 3.2 Temperature range | +105℃～+135℃(At 100% relative humidity) |
| 3.3Temp. fluctuation | ±0.5℃ |
| 3.4Temp. uniformity | ≤±3.0℃ |
| 3.5Temp. deviation | ≤±3.0℃ |
| 3.6 Humidity range |
1) HUM unsaturated test mode: 65~100%RH 2) STD saturation test mode: 100%RH |
| 3.7 Humidity Fluctuation | ±3.0％RH |
| 3.8 Humidity Deviation | ±5.0％RH |
| 3.9 Temperature change rate |
Heat up rate: +25℃～+135℃, full range average speed approx 45 min (no-load,no heating) |
| 3.10 Load | no |
| Note:Measured at a room temperature of +25 ℃ under no load,the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5 or IEC60068 -3; the sensor is placed at the air outlet of the air handling unit. | |
| 3.11 Pressure range |
Gauge pressure: +0.2 ~ 200Kpa *Absolute pressure: 100 ~ 300Kpa |
| 3.12 Pressure deviation | ≤±2 kPa |
| 3.13 Pressure rise time | Atmospheric pressure to 200Kpa 20min |
Chamber construction
| 4.1 Construction type |
Integral drum pressure vessel structure Comply with national safety container standards The inner box design of the drum prevents condensation on the top and dripping water |
| 4.2 Insulation enclosure structure | Outer spray plastic anti-corrosion electrolysis plate - intermediate insulation layer is temperature resistant foam insulation material - inner box SUS316 stainless steel plate |
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4.3 Exterior material |
High-quality anti-corrosion electrolytic board, surface electrostatic powder baking paint.,KOMEG standard color. |
| 4.4 Interior material |
SUS316 stainless steel; inner wall full-welded
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| 4.5 Insulation | Superfine glass wool insulation layer, flame retardant grade A1 |
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4.6 Door
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Single open the door, open to the left; Flush-mounted rotary handle |
| 4.10 Unit | Water storage tank, cooling air outlet, automatic water replenishment pump, water replenishment solenoid valve, water level box, drain hole |
Application :
It is widely used in IC semiconductors, connectors, circuit boards, magnetic materials, polymer materials, EVA, photovoltaic modules and other related products for accelerated aging life test
Product description
The purpose of the Highly Accelerated Aging Test (HAST) is to increase product environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the life test time of the product or system. , The reliability of semiconductor products has improved. At present, most electronic devices can withstand long-term high temperature and high humidity deviation tests without failure. Therefore, the test time used to determine the quality of the finished product has also increased a lot. In the design stage of the product, it is used to quickly expose the defects and weaknesses of the product, and test the sealing and aging performance of its products.
Features:
◆ The inner tank adopts double-layer arc design, which can prevent the phenomenon of condensation and dripping in the test, so as to avoid the direct impact of superheated steam on the product in the test process and affect the test result.
◆ Using 7-inch true color touch screen, with 250 groups of 12,500 programs, with USB curve data download function, RS-485 communication interface.
◆ Using wet and dry bulb sensor for direct measurement (control modes are divided into three modes: dry and wet bulb, unsaturated and wet saturation).
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