HD-E900 Potential Induced Degradation(PID) Test Machine

Price Negotiable

Price: Negotiable

MOQ: 1 Set

Delivery Time: 15 days after order confirmed

Brand: Haida

Product Description

HD-E900 Potential Induced Degradation(PID) Test Machine

APPLICATION

Potential Induced Degradation (PID) testing evaluates the ability of photovoltaic modules to resist potential-induced deterioration by simulating harsh electric field and humid heat conditions.

TECHNICAL PARAMETERS

Item	Specification
DC Regulated Power Supply	12 channels(Independently monitoring and control) Each channel can independently control the voltage polarity
Voltage range	-2000V ~ 2000V
Voltage resolution	1V
Voltage stability	For continuous output of 1000V, 1500V, and 2000V, voltage fluctuation is ≤2% within 500 hours
Connection method	Module frame grounded, connector shorted and then connected to the high-voltage terminal; for negative voltage testing and positive voltage recovery, only switch toggling is needed, no change in connection method required
Voltage application method	20 power channels operate independently, capable of outputting different polarities and voltages
Voltage accuracy	±3% (referencing CNAS-CL01-A021:2018)
Voltage tolerance	0.5% (referencing IEC 62804-1-1:2020)
Current measurement range	0~1mA Resolution: 0.01μA (as specified in IEC 62804-1-1:2020)
Acquisition interval	≤5min(adjustable at software)
Safety protection features	Overcurrent alarm, overvoltage alarm, overtemperature alarm, communication interface with environmental test chamber
Power	Single phase, 220V, 50Hz

TEST STANDARD

Items	Description
Test Standard	IEC61215-2: 2021 MQT 21 Potential Induced Degradation Test IEC 62804-1-1:2020“Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation Part 1-1 Crystalline silicon – Delamination" IEC 63209:2019 Extended-stress testing of photovoltaic modules