ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers

Overview:

ZL-1210 Thickness Gauge adopts mechanical contact measurement method, which strictly meets the standard requirements, effectively ensuring the standardization and accuracy of the test. Professionally applicable to the accurate measurement of the thickness of various materials such as plastic films, sheets, diaphragms, paper, foils, silicon wafers, etc. within the measuring range.

Expertise:

• Strictly designed contact area and measured pressure in accordance with standards, while supporting various non-standard customizations;
• The measuring head is automatically raised and lowered during the test, which effectively avoids system errors caused by human factors;
• Support both automatic and manual measurement modes, to facilitate users to choose freely;
• The system automatically injects samples, and the relevant parameters such as sampling step, measuring points and sampling speed can be set by the user;
• Real-time display of analysis data such as the maximum, minimum, average and standard deviation of measurement results to facilitate user judgment;
• Equipped with standard gauge blocks for system calibration to ensure test accuracy and data consistency;
• The system supports many practical functions such as real-time data display, automatic statistics, printing, etc., to obtain test results conveniently and quickly;
• The system is controlled by a microcomputer, with LCD display, menu interface and PVC operation panel, which is convenient for users to conduct test operation and data viewing;
• The standard USB interface is convenient for the external connection and data between the system and the computer.

Application:

Test principle:

The ZL-1210 film thickness measuring instrument adopts the principle of mechanical contact measurement to intercept a certain size of the pattern; through the control panel buttons, the measuring head is adjusted to fall on the pattern; the pressure generated by the two contact surfaces and the two contact areas are measured by the sensor The numerical value measures the thickness of the material.

Standard test:

The instrument complies with many national and international standards: ISO 4593, ISO 534, ISO 3034, GB/T 6672, GB/T 451.3, GB/T 6547, ASTM D374, ASTM D1777, TAPPI T411, JIS K6250, JIS K6783, JIS Z1702, BS 3983, BS 4817

Technical index:

Product configuration: