C Probe Metal Hardness Tester Impact Device with 3mm Tungsten Carbide Tip, 2.7mJ Energy for Surface-Hardened Components

Price Negotiable
Price: Negotiation
MOQ: 1
Delivery Time: 3-5 work days
Brand: TMTeck
Product Description
C Probe Metal Hardness Tester Impact Device

Professional C-type impact device for Leeb hardness testers featuring a tungsten carbide test tip. Designed for surface-hardened components, coatings, and brittle materials with minimal surface impact.

Key Features
  • Reduced impact energy (approximately 1/4 of Type D)
  • Tungsten carbide test tip with 1600HV hardness
  • Minimal surface damage - ideal for delicate components
  • 3mm diameter test tip for precision measurements
  • 2.7mJ impact energy with 3.0g impact body mass
Applications

Specifically designed for measuring small, light, thin parts and surface hardened layers where conventional impact devices would cause excessive damage.

Technical Specifications
Parameter Specification
Impact Energy 2.7mJ
Impact Body Mass 3.0g
Test Tip Diameter 3mm
Test Tip Material Tungsten Carbide (1600HV)
Device Dimensions 20mm diameter × 141mm length
Device Weight 75g
Max Sample Hardness 1000HV
Min Sample Thickness 1mm
Material Compatibility
Material Type Hardness Range (HRC) Hardness Range (HB) Hardness Range (HV)
Steel and Cast Steel 20.0-69.5 80-683 80-996
Cold Work Tool Steel 20.7-68.2 - 100-941
Cast Aluminium Alloys - 23-210 -
Impact Device Comparison

Type C vs Type D: While D-type is used for conventional measurements, C-type offers smaller impact force, minimal damage to measured surfaces, and preserves hardened layers. Ideal for precision applications requiring non-destructive testing.

C Probe Metal Hardness Tester Impact Device with tungsten carbide test tip

Get in Touch

Have questions about our products or want to discuss a custom order? Our team is ready to help you.

Company TMTeck Instrument Co., Ltd
Location #613A, LinJI Industrial Building ,No.53 of Shun Ren Road ,Lin He Industrial park, ShunYi District ,101300 Beijing ,China
Contact Person WEI

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