This equipment realizes accurate identification of various defects in beans and miscellaneous grains based on color, size, shape and texture features.

• High-capacity vibrating feeder ensures uniform and monolayer spreading of materials, effectively minimizing overlapping.
• Sealed scanning area and control cabinet deliver high-level dust protection.
• Field-proven integrated dust-proof system guarantees reliable operation and stable performance, maximizing equipment uptime.
• Modular design (vertical rack supports 1–12 channels, with optional configurations of 1/4/6/8/10/12 channels) offers superior flexibility for processors.

• Equipped with independently developed AI deep learning algorithm, which continuously optimizes the defect recognition model with new sample data.
• Integrated with high-resolution RGB camera system and high-brightness LED lighting.
• Optional near-infrared (NIR) or short-wave infrared (SWIR) camera system available.

It achieves top-tier defect recognition covering the following categories:

• Discoloration defects: Moldy, oxidized, immature or contaminated kernels.
• Breakage defects: Cracked or shattered particles.
• Insect damage defects: Kernels infested by pests.
• Disease defects: Spots caused by fungal or bacterial infections.
• Foreign material defects: Straw, stones, glass, plastics, metals, etc.

Parameter customization is supported for different varieties of beans and miscellaneous grains, adapting to diverse production requirements.