Four-Channel 24.5 To 29Gb/S Tunable Error Meter For 100G TOSA/ROSA Devices
Four-Channel 24.5 To 29Gb/S Tunable Error Meter For 100G TOSA/ROSA Devices
The four-channel 24.5~29Gb/s tunable bit error tester is a kind of high-precision and cost-effective test equipment, which is mainly used in the field of optical communication error test.
Product overview
The four-channel 24.529Gb/s tunable error meter is a test instrument that integrates the functions of internal reference clock, graphic signal generator, clock recovery circuit and error analysis. It supports four-channel parallel testing, each channel rate up to 24.529Gb/s, suitable for a variety of high-rate communication devices test requirements.
Product characteristics
High precision and high performance: The error tester can provide high precision error testing to ensure the accuracy and reliability of the test results.
Multi-channel parallel testing: Support four-channel parallel testing, improve the test efficiency, especially for the need to test multiple devices at the same time.
Tunability: The rate range can be tuned from 24.5Gb/s to 29Gb/s to meet the test needs of different rate devices.
Integrated design: A variety of test functions are integrated into one, reducing the size and complexity of the equipment, and improving the ease of use.
Rich test functions: In addition to the basic error test, it also supports the eye map test, transmission system bit rate and characteristic test.
Easy to operate: Usually has a friendly user interface and simple operation flow, so that operators can quickly get started and efficiently complete the test task.
Specification
| Absolute Maximum Ratings | Symbol | Min. | Typ. | Max. | Unit | Notes |
| Storage Temperature | Ts | -20 | – | 70 | °C | |
| AC Voltage Range | VAC | 90 | – | 246 | VAC | |
| AC Voltage Frequency Range | VFREQ | 47 | – | 63 | Hz | |
| Data RF Voltage Input | VinData | -0.3 | – | 1.2 | V | |
| Clock In Voltage Input | VinClk | 0 | – | 1.2 | V | |
| USB Pin Voltage | VinUSB | -0.3 | – | 5.5 | V | |
| RF and Clock ESD HBM | RFesdH | -1000 | – | 1000 | V | |
| RF, Clock and USB Latchup | Vl | -100 | – | 100 | mA | |
| USB ESD HBM | USBesdH | -2000 | – | 2000 | V | |
| USB ESD CDM | USBesdC | -500 | – | 500 | V | |
| Electrical Characteristics | Symbol | Min. | Typ. | Max. | Unit | Notes |
| Case Temperature | Tc | 5 | – | 45 | °C | |
| AC Supply Current | Icc | 0.75 | 200 | – | mA | |
| Baud Rate (NRZ format) | BR | 12.25/24.5 | 14.5/29 | Gb/s | ||
| Baud Rate Setpoint Accuracy | BRa | -10 | – | 10 | PPM | (Note 1) |
| Baud Rate PPM Offset | BRo | -999 | – | 999 | PPM | 1 PPM step size |
| Power On Initialization Time | Ton | – | – | 15 | Seconds | |
| Eye Phase Steps | EMp | – | – | 128 | Steps | .16 pS per unit |
| Eye Amplitude Steps | EMv | – | – | 64 | Steps | 8 mV per unit |
| Note 1: Aging, Temperature and Voltage | ||||||
Scope of application
The four-channel 24.5~29Gb/s tunable error meter has a wide range of applications in the field of optical communication, including but not limited to the following aspects:
Optical transceiver module test: such as CFP2, CFP4, QSFP28, SFP+, XFP and other modules error test.
Photoelectric components and equipment testing: such as TOSA, ROSA, laser and other photoelectric components and equipment error test.
High-speed Integrated Circuit and circuit board testing: Used to test the error performance of Gbps class integrated circuits (ICs) and circuit boards (PCBs).
Serial bus and high-speed backplane design tests: Used to verify the signal integrity and bit error rate of the system during the serial bus and high-speed backplane design process.
Optical transmission network installation testing and troubleshooting: Used to test system error performance and troubleshoot faults during the installation and commissioning of optical transmission network.
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