The Keysight 81160A pulse function arbitrary noise generator is a high-precision pulse generator enhanced with versatile signal generation, modulation, and distortion capabilities to stress your device to its limit. For the same integrated functionality in a cost-effective package, with pulse frequency up to 120 MHz and sine frequency up to 240 MHz

Keysight 81160A pulse function arbitrary noise generator sets the standard for the next generation of lab equipment, providing fast, accurate insight into your design or device under test and serving as an indispensable contributor to accelerate ideal and real-world testing.

• Pulse Generator: Guarantees reproducible tests with precise signals and unbeatable timing stability.
• Noise Generator: Combines two required extremes: random noise and repeatable noise with very long repetition rates for simple problem identification.
• Function Arbitrary Generator: Provides versatile waveforms and modulation capabilities to adapt the signal to your device requirements.
• Arbitrary Bit-Shaped Pattern Generator: (Optional) Allows ideal and distorted pattern up to 330 Mbit/s.

Keysight 81160A stresses your device limits for a vast spectrum of applications, including:

• Digital and mixed-signal device test
• Radar distance test
• Sensor simulation

Benefits include accurate signals that test your device and not your signal source, versatile waveform and noise generation to meet stress test challenges, and a plug-and-play solution with everything integrated into one instrument to minimize cabling, space, and test time.

• Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution
• Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards
• Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test
• Arbitrary bit patterns show capacitive load of the channels using simple pattern settings, eliminating the need for complex measurement setups
• Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern