92% High Quantum Spectrometer for Film Thickness Measurement Spectral Range 200nm 1100nm
Thin film technology plays a vital role across industries like semiconductors, solar energy, displays, and optical coatings. Our high quantum efficiency spectrometer provides precise, non-contact thickness measurement for analyzing surface morphology, combining smart algorithms with optical devices for accurate quality assessment.
| Detector Specifications | ||
|---|---|---|
| Detector | Chip Type | Back-illuminated TE-cooled Hamamatsu S7031 |
| Effective Pixel | 1024*122 | |
| Pixel Size | 24*24μm | |
| Sensing Area | 24.576*2.928mm | |
| Optical Parameters | |
|---|---|
| Optical Design | F/4 cross-type |
| Numerical Aperture | 0.13 |
| Focal Length | 100mm |
| Entrance Slit Width | 10μm,25μm,50μm,100μm,200μm (customizable) |
| Fiber Interface | SMA905, free space |
- High quantum efficiency: 92% peak @650nm, 83% @232nm
- High SNR: Ultra-low dark noise with SNR up to 1000:1
- Noise-free processing of weak signals in long exposure
- Low-noise, high-speed circuit with USB3.0 interface
The spectrometer analyzes interference patterns created by reflected beams from film surfaces and substrate boundaries. Film thickness is calculated using the extremum method, accounting for incident angle, refractive index, and spectral peak positions. This non-contact method provides precise measurements for quality control and process improvement.
- Absorption, transmittance and reflection spectrum analysis
- Light source and laser wavelength characterization
- OEM modules for fluorescence and Raman spectroscopy
| Model | Spectral Range(nm) | Resolution(nm) | Slit(μm) |
|---|---|---|---|
| SR100Q-G21 | 200~950 | 6.8 | 200 |
| SR100Q-G22 | 350~1100 | 2.2 | 50 |
| SR100Q-G23 | 200~775 | 1.6 | 50 |
| SR100Q-G24 | 350~925 | 1.0 | 25 |
| SR100Q-G25 | 532~690(4400cm-1*) | 13cm-1 | 50 |
| SR100Q-G26 | 638~800(3200cm-1) | 10cm-1 | 25 |
| SR100Q-G27 | 785~1050(3200cm-1) | 11cm-1 | 50 |
Note: Models marked with * are primarily designed for Raman applications.
JINSP Company Limited is a professional supplier with over 17 years of experience in spectral detection technology, including Raman, FT-IR, and LIBS technologies. Our core technologies have reached international leading levels with over 200 patent applications.
Headquartered in Beijing with a manufacturing facility in Jiangsu, China, JINSP holds ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. We provide various industry certifications including CE, ECAC, and ICT Security Testing.
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