SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer

From microchips to solar modules, thin film applications demand exact thickness characterization. Photoelectric measurement emerges as the preferred approach--preserving sample integrity while delivering rapid results. Smart optical systems now enable comprehensive surface analysis, facilitating both precision manufacturing and next-gen material development.

The JINSP SR100Q spectrometer is integrated with the Hamamatsu S7031, a scientific-grade TE-cooled area array CCD chip. With a pixel size of up to 24*24μm and excellent quantum efficiency of up to 92%, it ensures high response in the ultraviolet band and effectively improves the sensitivity and SNR of weak signals. Furthermore, it can realize excellent spectrum signals, and stable and reliable performance based on the advanced high-resolution light path and low-noise, high-speed FPGA signal processing chip.

• High quantum efficiency, 92%peak@650nm, 83%@232nm
• High SNR: Ultra-low dark noise under long integration time, SNR is as high as 1000:1
• Noise-free clear processing of weak signal in long exposure, strong adaption to environment
• Low-noise and high-speed circuit: USB3.0

The measurement system employs a fiber-optic probe to illuminate the film, generating reflections at both the air-film and film-substrate interfaces. These beams interfere, forming a spectrum analyzed by the spectrometer. By applying the extremum method--factoring in θ, n, and spectral extrema--film thickness (d) is computed. Fringe density correlates with thickness, while wavelength inversely affects it. Careful spectral range and resolution adjustments ensure reliable results.

• Detect absorption, transmittance and reflection Spectrum
• Light source and laser wavelength characterization
• OEM product module: Fluorescence spectrum, Raman spectrum, etc.

JINSP Company Limited, abbreviated as "JINSP", is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, LIBS technologies, etc. After 17 years of technology accumulation, the company's core key technologies have reached the international leading position at the level, and the cumulative number of patent applications exceeded 200.

In addition to its main headquarters located in the bustling city of Beijing, JINSP has established a fully owned subsidiary manufacturing facility situated in the province of Jiangsu, China.

JINSP Company received ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. JINSP can provide required certifications, such as certification by the Ministry of Public Security or National Institute of Metrology, Environmental Level Certification, IP Level Certification, CE Certification, Transport Identification Report, EU ECAC certification, German ICT Security Testing, etc.