TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectrual Range 200nm 1100nm
| Spectral Range | 200nm - 1100nm |
| Effective pixels | 1024×122 |
| Quantum Efficiency | QE92% peak @650nm, 83%@232nm |
| SNR | 1000:1 |
The widespread use of thin films in high-tech industries requires advanced thickness assessment methods. Our photoelectric technology provides non-invasive, high-efficiency measurement protocols. By combining spectral analysis with machine learning, manufacturers achieve precise control over film properties, enabling product innovation.
The JINSP SR100Q spectrometer integrates the Hamamatsu S7031, a scientific-grade TE-cooled area array CCD chip. With a pixel size of 24×24μm and quantum efficiency up to 92%, it delivers high response in the ultraviolet band while improving sensitivity and SNR for weak signals. The advanced high-resolution optical path and low-noise, high-speed FPGA signal processing chip ensure excellent spectrum signals and reliable performance.
| Detector Specifications | ||
|---|---|---|
| Detector | Chip Type | Back-illuminated TE-cooled Hamamatsu S7031 |
| Effective Pixel | 1024×122 | |
| Pixel Size | 24×24μm | |
| Sensing Area | 24.576×2.928mm | |
| Optical Parameters | ||
| Optical Design | F/4 cross-type | |
| Numerical Aperture | 0.13 | |
| Focal Length | 100mm | |
| Entrance Slit Width | 10μm, 25μm, 50μm, 100μm, 200μm (customizable) | |
| Fiber Interface | SMA905, free space | |
| Electrical Parameters | ||
| Integration Time | 8ms-3600s | |
| Data Output Interface | USB3.0, RS232, RS485, 20pin connector | |
| ADC Bit Depth | 16-bit | |
| Power Supply | 5V | |
| Operating Current | <3.5A | |
| Physical Parameters | ||
| Operating Temperature | 10℃~40℃ | |
| Storage Temperature | -20℃~60℃ | |
| Operating Humidity | <90%RH (no condensation) | |
| Dimensions | 180mm×120mm×50mm | |
| Weight | 1.2kg | |
| Model | Spectral Range(nm) | Resolution(nm) | Slit(μm) |
|---|---|---|---|
| SR100Q-G21 | 200~950 | 6.8 | 200 |
| SR100Q-G22 | 350~1100 | 2.2 | 50 |
| SR100Q-G23 | 200~775 | 1.6 | 50 |
| SR100Q-G24 | 350~925 | 1.0 | 25 |
| SR100Q-G25 | 532~690(4400cm-1)* | 13cm-1 | 50 |
| SR100Q-G26 | 638~800(3200cm-1)* | 10cm-1 | 25 |
| SR100Q-G27 | 785~1050(3200cm-1)* | 11cm-1 | 50 |
*Models primarily designed for Raman applications, with corresponding Raman configurations.
- High quantum efficiency: 92% peak @650nm, 83%@232nm
- High SNR: Ultra-low dark noise under long integration time, SNR up to 1000:1
- Noise-free processing of weak signals during long exposure with strong environmental adaptation
- Low-noise, high-speed circuit with USB3.0 interface
Light transmitted via optical fiber reflects at the film's upper and lower surfaces, creating two phase-shifted beams. Their interference spectrum, recorded by the spectrometer, enables thickness calculation using the extremum method with θ, n, and peak/trough data. Thicker films increase fringe frequency, while longer wavelengths decrease it. Optimal measurement requires proper spectral range and resolution selection.
- Absorption, transmittance and reflection spectrum detection
- Light source and laser wavelength characterization
- OEM product modules: Fluorescence spectrum, Raman spectrum, etc.
JINSP Company Limited ("JINSP") is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, and LIBS technologies. After 17 years of technological development, our core technologies have reached internationally leading levels, with over 200 cumulative patent applications.
Headquartered in Beijing, JINSP operates a manufacturing facility in Jiangsu Province, China. We maintain ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications, and can provide additional certifications including:
- Ministry of Public Security or National Institute of Metrology certification
- Environmental Level Certification
- IP Level Certification
- CE Certification
- Transport Identification Report
- EU ECAC certification
- German ICT Security Testing
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