Spectrual Range 200nm 1100nm Fiber Optic Spectrometer for Film Thickness Measurement in Optoelectronics and Energy Devices
| Attribute | Value |
|---|---|
| Spectrual Range | 200nm - 1100nm |
| Effective pixels | 1024*122 |
| Quantum Efficiency | QE92%peak@650nm, 83%@232nm |
| SNR | 1000:1 |
As thin films become essential components in optoelectronics and energy devices, accurate thickness measurement is critical. Our photoelectric solutions provide non-contact measurement that eliminates damage risks while delivering superior precision through advanced adaptive algorithms.
| Category | Parameter | Value |
|---|---|---|
| Detector | Chip Type | Back-illuminated TE-cooled Hamamatsu S7031 |
| Effective Pixel | 1024*122 | |
| Pixel Size | 24*24μm | |
| Sensing Area | 24.576*2.928mm | |
| Optical Parameters | Optical Design | F/4 cross-type |
| Numerical Aperture | 0.13 | |
| Focal Length | 100mm | |
| Entrance Slit Width | 10μm,25μm,50μm,100μm,200μm (customizable) | |
| Fiber Interface | SMA905, free space | |
| Electrical Parameters | Integration Time | 8ms-3600s |
| Data Output Interface | USB3.0, RS232, RS485, 20pin connector | |
| ADC Bit Depth | 16-bit | |
| Power Supply | 5V | |
| Operating Current | <3.5A | |
| Physical Parameters | Operating Temperature | 10℃~40℃ |
| Storage Temperature | -20℃~60℃ | |
| Operating Humidity | <90%RH (no condensation) | |
| Dimensions | 180mm*120mm*50mm | |
| Weight | 1.2kg | |
| Model | Spectral Range(nm) | Resolution(nm) | Slit(μm) |
|---|---|---|---|
| SR100Q-G21 | 200~950 | 6.8 | 200 |
| SR100Q-G22 | 350~1100 | 2.2 | 50 |
| SR100Q-G23 | 200~775 | 1.6 | 50 |
| SR100Q-G24 | 350~925 | 1.0 | 25 |
| SR100Q-G25 | 532~690(4400cm-1*) | 13cm-1 | 50 |
| SR100Q-G26 | 638~800(3200cm-1*) | 10cm-1 | 25 |
| SR100Q-G27 | 785~1050(3200cm-1*) | 11cm-1 | 50 |
Note: Models marked with * are primarily designed for Raman applications.
- High quantum efficiency: 92% peak at 650nm, 83% at 232nm
- Superior signal-to-noise ratio: Ultra-low dark noise with SNR up to 1000:1
- Advanced signal processing: Clear detection of weak signals during long exposures with strong environmental adaptation
- High-speed data transfer: USB3.0 interface with low-noise circuitry
The optical fiber probe delivers light to the film, producing reflections at the air-film and film-substrate boundaries. The spectrometer captures the interference pattern formed by these beams, from which thickness (d) is derived via the extremum method (using θ, n, and spectral features). Fringe spacing varies with thickness (inversely with wavelength), necessitating tailored spectral parameters for accuracy.
- Absorption, transmittance and reflection spectrum analysis
- Light source and laser wavelength characterization
- OEM modules for fluorescence and Raman spectroscopy
JINSP Company Limited is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, and LIBS technologies. Our core technologies have reached internationally leading levels, with over 200 patent applications.
Headquartered in Beijing with a manufacturing facility in Jiangsu, China, JINSP holds ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. We can provide various required certifications including CE Certification, EU ECAC certification, and German ICT Security Testing.
Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.