100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy
Price:
999
MOQ:
3000pcs
Delivery Time:
5-8 WORKING DAYS
Brand:
WINNER
Product Description
Standard ICT Test Probes - 100mil - Crown (CA, CB, CC, CG)
These spring-loaded test probes are designed for ICT test fixtures (bed of nails), offering high hitting accuracy and long-life expectancy. The 4-point crown tip on CA, CB, and CC versions ensures excellent component pin contact, while the CG version features a multipoint tip for versatile applications. The CC version includes self-cleaning functionality.
Product Specifications
| Specification | Details |
|---|---|
| Type | Probe test pin |
| Material | Brass |
| Plating Layer | Gold Plated |
| Color | Gold |
| Package | PE Bag |
| Current resistance | 50mΩ |
| MOQ | 100PCS |
| Payment | T/T |
| Delivery time | 5-10 days after receiving payment |
Test Probe Selection Guide
Test probes are available from many manufacturers with similar constraints. When selecting a test probe receptacle, the tip choice is the most critical consideration.
Detailed illustration of test probe components and construction
Various test probe tip types
Customization Options
At SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD., we offer comprehensive customization:
- Custom diameters to match your specific requirements
- Custom plating thicknesses for optimal conductivity and durability
- Custom mechanical specifications tailored to your application
Contact us to request samples or a quotation for your specific application requirements.
Our probe manufacturing facility
Quality control inspection
Packaged probes ready for shipment
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Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.
Company
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Location
B105, 90-5 Dayang Road, Rentian Community, Fuhai Street, Bao'an District, Shenzhen,P.R.China
Contact Person
Jiang