PCT High Pressure Accelerated Aging Test Chamber 105℃ to 132℃ with 2.0 Kg/cm² Pressure for Semiconductor Reliability Testing
Price:
Negotiable
MOQ:
1 set
Delivery Time:
7-22 work days
Brand:
Neide
Product Description
PCT High Pressure Accelerated Aging Test Chamber
The PCT (Pressure Cooker Test) Aging Chamber is essential equipment for semiconductor manufacturers to evaluate product reliability under extreme environmental conditions. This specialized chamber subjects semiconductor samples to precisely controlled temperature, humidity, and pressure settings to assess pressure resistance and airtightness.
Key Technical Specifications
| Parameter | Range | Notes |
|---|---|---|
| Temperature range | 105℃ to +132℃ | Saturated vapor temperature |
| Humidity range | 100%RH | Saturated vapor humidity |
| Pressure range (gauge pressure) | 0.2 Kg/cm² to 2.0 Kg/cm² (2.2 Kg/cm²) | Control point pressure (Safe pressure capacity 3.5 Kg/cm²) |
| Time scale | 0 to 999 hours | Adjustable |
| Temperature distribution | ≤± 2.0℃ |
Product Features
- Identifies potential weaknesses in semiconductor design and manufacturing
- Simulates harsh operating environments for reliability testing
- Enables critical insights into product performance and durability
- Helps manufacturers develop more robust semiconductor products
Manufacturing & Support
Customized solutions available with SUS304 material or customer-specified alternatives. Our factory serves over 500+ customers worldwide with comprehensive after-sales support and 24-hour response time for technical issues.
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Get in Touch
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Company
Dongguan Neide Technology Co., Ltd
Location
No. 13, Shihuan Road, Dongcheng Sub-district, Dongguan City, Guangdong Province
Contact Person
Coco