Single Channel PXI SMU 30V 1A Sub Card DC Source Measurement Unit CS100

     The CS100 modular subcard is a high-performance testing module designed for integration with modular chassis systems. Delivering exceptional precision and versatility, it provides efficient solutions for complex testing scenarios. As a core component of the testing ecosystem, the CS100 subcard synergizes with the main chassis to adapt to diverse industry requirements, from semiconductor validation to industrial automation.

Product Features

▪ High-precision Measurement: Achieves 0.1% accuracy across full measurement ranges.

▪ Rapid Response: 1 kS/s sampling rate ensures real-time data acquisition and processing.

▪ Flexible Configuration: Seamlessly integrates with other subcards for customized test setups.

▪ Trigger Customization: Flexible channel-trigger bus configuration enables multi-test function combinations.

▪ Easy Integration: Compact design compatible with standard 19-inch racks for streamlined deployment.

Product Parameters

Applications

▪ Semiconductor Testing:Supports electrical parameter testing (e.g., on-resistance, leakage current) for chips and transistors, enabling quality control and performance optimization in R&D and production.

▪ New Energy Battery Testing:Evaluates lithium-ion/solar battery performance metrics like charge-discharge cycles, capacity, and internal resistance to accelerate energy storage technology development.

▪ Electronic Component Validation:Precision measurement of passive components (resistors, capacitors, inductors) to ensure compliance with industrial reliability standards.

▪ Academic Research:Serves as a modular test platform for universities and labs in electrical engineering and materials science, enabling cutting-edge experiments in MEMS, flexible electronics, and more.