18V 1A Four Channel Sub Card Pulse Source Measure Unit CBI403 SMU Measurement
18V 1A Four Channel Sub Card Pulse Source Measure Unit CBI403 SMU Measurement
The CBI401 modular subcard is a member of the CS Series Source Measure Unit (SMU) family, designed for high-precision, high-dynamic-range electrical characterization. Its modular architecture allows flexible integration with both the 1003CS (3-slot) and 1010CS (10-slot) host systems. When combined with the 1010CS host, users can configure up to 40 synchronized channels, dramatically enhancing testing throughput for applications such as semiconductor wafer-level validation and multi-device parallel stress testing.
Product Features
▪ High-Precision Sourcing/Measurement:0.1% accuracy with 5½-digit resolution across full voltage/current ranges.
▪ Four-Quadrant Operation:Supports sourcing/sinking modes (±10V, ±1A) for dynamic device profiling.
▪ Dual Testing Modes:Pulsed and DC operation for flexible characterization of transient and steady-state behaviors.
▪High Channel Density:4 channels per subcard with shared ground architecture, enabling dense parallel testing configurations.
▪ Configurable Trigger Bus:Multi-subcard synchronization via programmable trigger signals for coordinated multi-device workflows.
▪ Advanced Scanning Modes:Linear, exponential, and user-defined IV curve scanning protocols.
▪ Multi-Protocol Connectivity:RS-232, GPIB, and Ethernet interfaces for seamless integration into automated test systems.
▪ Space-efficient Modularity:1U-height design optimizes rack space utilization while supporting scalable channel expansion.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
1~18V |
|
Minimum Voltage Resolution |
100uV |
|
Current Range |
5uA～1A |
|
Minimum Current Resolution |
200nA |
|
Minimum Pulse Width |
100μs, maximum duty cycle 100% |
|
Maximum Current Limit |
|
|
Programmable Pulse Width Resolution |
1μs |
|
Maximum Continuous Wave (CW) Output Power |
10W, 4-quadrant source or sink mode |
|
Maximum Pulse (PW) Output Power |
10W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Nanomaterial Characterization:Electrical property testing of graphene, nanowires, and other nanomaterials, providing critical data to advance material R&D and applications.
▪ Organic Material Analysis:Electrical characterization of e-ink and printed electronics, supporting innovation in organic electronic technologies.
▪ Energy & Efficiency Testing:Performance optimization and efficiency validation for LEDs/AMOLEDs, solar cells, batteries, and DC-DC converters.
▪ Discrete Semiconductor Testing:Comprehensive electrical characterization of resistors, diodes (Zener, PIN), BJTs, MOSFETs, and SiC devices to ensure compliance with quality standards.
▪ Sensor Evaluation:Resistivity and Hall-effect testing for sensor R&D, production, and quality control.
▪Low-power Laser Aging:Long-term reliability testing for VCSELs and butterfly lasers, monitoring performance degradation to assess lifespan and operational stability.
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