100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200
100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200
The CS200 modular subcard is a high-precision, single-channel digital Source-Measure Unit (SMU) designed for multi-slot modular host systems. As a core component of the CS Series, this subcard integrates voltage/current sourcing, voltmeter/ammeter functions, and electronic load capabilities into a single module. Supporting four-quadrant operation (sourcing/sinking modes), it enables simultaneous current/voltage sourcing and measurement, making it ideal for complex electrical characterization tasks such as semiconductor parametric analysis and power device validation.
Product Features
▪ Precision: 0.1% source/measurement accuracy with 5½-digit resolution.
▪ Ranges: Voltage 300 mV–100 V, current 100 nA–1 A, max power 30 W.
▪ Operational Modes: Four-quadrant operation for both sourcing and electronic loading.
▪ Scalability: Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts.
▪ Multi-channel Control: Trigger bus enables synchronized scanning or independent operation across subcards.
▪ Scan Modes: Linear, exponential, and custom IV curve scanning for complex characterization.
▪ Interfaces: RS-232, GPIB, and Ethernet for seamless integration into automated test systems.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
1 channels |
|
Voltage Range |
300mV~100V |
|
Minimum Voltage Resolution |
30uV |
|
Current Range |
100nA～1A |
|
Minimum Current Resolution |
10pA |
|
Maximum Continuous Wave (CW) Output Power |
30W, 4-quadrant source or sink mode |
|
Voltage Source Limits |
±30V (for the range ≤1A), ±100V (for the range ≤100mA) |
|
Current Source Limits |
±1A (for the range ≤30V), ±100mA (for the range ≤100V) |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:IV characterization and parametric analysis of discrete devices (diodes, BJTs, MOSFETs, SiC devices).
▪ Sensor evaluation, including resistivity measurement and Hall effect analysis.Advanced Materials & Energy ▪ Technologies:Electrical property characterization of nanomaterials (graphene, nanowires) and organic materials (e-ink).Efficiency evaluation and aging assessment for solar cells, LEDs, and AMOLEDs.
▪ Industrial & Research Applications:Multi-channel parallel test systems for battery cycle testing and DC-DC converter efficiency validation.High-density testing solutions (e.g., wafer-level testing) via multi-subcard collaboration to enhance throughput.
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