High Cycle ATE IC Test Sockets 30K-50K Insertions for DDR5/LPDDR5 Memory Testing
Precision-engineered ATE IC sockets optimized for high-speed memory testing applications including DDR5 and LPDDR5 ICs. These rugged sockets deliver exceptional signal integrity at multi-GHz speeds with ultra-low skew, minimal crosstalk, and stable impedance—critical for data centers, AI accelerators, and next-generation memory validation.
- Superior durability with 30,000-50,000 insertion cycles for demanding production testing
- Broad compatibility supporting BGA, QFN, SOP, and various IC package types
- Precision contact technology using low-resistance spring probes or pogo pins
- Custom configurations tailored to unique IC designs and testing requirements
- Thermal and high-frequency options for burn-in, high-temperature, and RF testing
| Property | Parameter | Typical Value |
|---|---|---|
| Mechanical | Insertion Cycles | ≥30,000-50,000 cycles |
| Contact Force | 20-30g/pin | |
| Operating Temperature (Commercial) | -40°C to +125°C | |
| Operating Temperature (Military) | -55°C to +130°C | |
| Tolerance | ±0.01mm | |
| Electrical | Contact Resistance | <50mΩ |
| Impedance | 50Ω (±5%) | |
| Current | 1.5A-3A |
Our custom test sockets ensure accuracy and repeatability for prototype validation, IC programming, and high-volume production testing. Engineered for challenging environments, these sockets feature robust mechanical designs that prevent warping under thermal stress while maintaining stable contact resistance. Fully compatible with automated handlers and testers, they streamline validation processes while reducing downtime.
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