Ⅰ,Key technology

(1)Dual optical path design improves repeatability accuracy dE*ab≤0.03

The dual optical path design monitors light source energy fluctuations while measuring the sample signal, reducing interference during measurement, obtaining higher measurement stability and improving the instrument's measurement repeatability index to dE*ab ≤ 0.03, which guaranteed the measuring speed, accuracy and stability of the instrument.   Related technologies are protected by Chinese invention patents and US invention patents.

(1)Innovative 5 micron thick nano-integrated optics

After intensive research, using nano-integrated optical devices as light splitters, only 5 micron thick optical devices can achieve nano-level light splitting ability, once again leading the direction of industry innovation, greatly improving the technical performance of products. Relevant technologies are protected by Chinese invention patents.

Ⅱ,Product features

(1)Over 30 Measurement Indicators

   • RGB,Lab,Reflectance,LCh,Hunter Lab,CIE-Luv,XYZ,Yxy

   • Difference(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00)

   • WI(ASTM E313-00,ASTM E313-73,CIE/ISO,AATCC,Hunter,Taube Berger Stensby)

   • YI(ASTM D1925,ASTM E313-00,ASTM E313-73)

   • Blackness(My,dM),Color Fastness,Tint(ASTM E313-00)

   • Color Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Color strength

(2)Evaluate whether the color is jumping light, and provide nearly 40 evaluation light sources

A, B, C, D50, D55, D65 and nearly 40 evaluation light sources can be selected, covering almost all the color measurement indicators and light source types in the industry.

(3)Contains SCI measurement mode

SCI refers to specular reflections that are generally used to study the properties of a color itself without regard to the surface gloss of the sample to which it is attached