Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed
Automatic Magnetic Chip Final Test Machine
Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different temperature conditions, ensuring chip performance and reliability across multiple extreme environments. Equipped with precision temperature sensors for high-accuracy three-temperature testing, a magnetic field control system providing in-plane and normal plane stable controllable magnetic fields, non-magnetic test seats, and thermal sinks, along with electrical source meters, it creates a testing environment for non-destructive, batch testing of magnetic and electrical properties of chips, playing an important role in magnetic chip development and production.
| Indicator Category | Description |
|---|---|
| Excitation System | The maximum magnetic field intensity on the X-axis is ±2000 Oe; The uniformity of the X-axis magnetic field is ≤±1%@2000 Oe@Φ35 mm spherical space; The true value of the magnetic field under zero magnetic field is ≤0.1 Oe; |
| High-precision Magnetic Field Sensor | The resolution of the magnetic field monitor is ≤10 μT |
| Electric Displacement Stage Module | θ-axis adjustment range: ±180°; rotational accuracy ≤1°; equipped with an absolute position encoder |
| Temperature Control System | The outlet temperature supports a range of -70°C to 220°C; |
| Test Ambient Temperature Module |
The internal temperature range of the Socket is -60°C to 170°C It is equipped with a temperature monitoring module, with a temperature accuracy of ≤0.5°C; |
| Socket Test Seat | The test seat can withstand temperatures ranging from -60°C to 170°C; The material is non-magnetic |
- Power-On Response Time
- Digital Output VS Magnetic Flux Density & Sampling Pulse
- TMR Sensor Chip Temperature Output Characteristic Curve
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