50 mT Magnetic Probe Station RH Testing Wafer Probe Stations For Magnetic Film Measurement
Cost Effective Wafer Probe Station For Magnetic Film Measurement
Product Description:
Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 mT.
One of the key features of this product is its compatibility with sample sizes of 8-inch and below, making it ideal for a wide range of applications in the semiconductor industry. The station is capable of handling magnetic field strengths of up to 50 mT, ensuring reliable and accurate measurements for various testing scenarios.
The Wafer-Level Manual In-Plane Magnetic Field Probe Station is equipped with 4 groups of DC probes, allowing for versatile and efficient testing capabilities. This probe seat configuration enables users to perform detailed measurements with ease and precision, enhancing the overall testing experience.
Designed to be cost-effective and user-friendly, this probe station offers a comprehensive solution for wafer-level electrical measurement, specifically tailored for in-plane magnetic field testing. Whether you are conducting research, development, or quality control, this product provides the tools and functionality needed to achieve accurate and reliable results.
Features:
- Product Name: Wafer-Level Manual In-Plane Magnetic Field Probe Station
- Magnetic Field Uniformity: Better Than ±1%φ1 mm
- Magnetic Field Strength: 50 mT
- Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 mT
- Optical Magnification: 0.75 X-5 X
- Probe Seat: 4 Groups Of DC Probes
Technical Parameters:
| Testing Functions | RH Testing |
| Magnetic Field Strength | 50 mT |
| Probe Seat | 4 Groups Of DC Probes |
| Sample Size | Compatible With 8-inch And Below |
| Magnetic Field Resolution | PID Closed-loop Feedback Regulation, Resolution 0.05 mT |
| Optical Magnification | 0.75 X-5 X |
| Magnetic Field Uniformity | Better Than ±1%φ1 mm |
Applications:
Truth Instruments presents the Wafer-Level Manual In-Plane Magnetic Field Probe Station, model number PS1D-Manu8, designed and made in CHINA. This advanced probe station is ideal for a variety of Product Application Occasions and Scenarios due to its exceptional features.
With a Magnetic Field Resolution of PID Closed-loop Feedback Regulation, achieving a remarkable resolution of 0.05 mT, this probe station offers Precise Control over magnetic field measurements. It is suitable for applications requiring High Precision in magnetic field analysis.
The Wafer-Level Manual In-Plane Magnetic Field Probe Station is compatible with sample sizes of 8-inch and below, making it versatile for different testing requirements. The Magnetic Field Strength capability of up to 50 mT allows for accurate measurements even in demanding scenarios.
Equipped with 4 Groups of DC Probes, this probe station enables DC and RF probing, catering to a diverse range of testing functions. Whether you need to conduct RH Testing or other detailed analyses, this probe station offers the necessary tools for comprehensive testing.
Whether you are in research and development, quality control, or academic settings, the Truth Instruments Wafer-Level Manual In-Plane Magnetic Field Probe Station provides a reliable solution for your magnetic field measurement needs. Its precise control, compatibility with various sample sizes, and high precision capabilities make it a valuable asset for magnetic field analysis in different Product Application Occasions and Scenarios.
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