AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications
The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, featuring strong stability and good scalability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and achieving an efficient detection platform with multiple uses in one machine.
| Index | Specification |
|---|---|
| Sample Size | 25 mm |
| Scanning Method | XYZ three-axis full sample scanning |
| Scanning Range | 100 μm×100 μm×10 μm |
| Scanning Rate | 0.1-30 Hz |
| Noise Level In The Z Direction | 0.04 nm |
| Nonlinearity | 0.15% in the XY direction and 1% in the Z direction |
| Image Sampling Point | The maximum resolution of the scanning probe image is 4096×4096 |
| Working Mode | Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode |
| Multifunctional Measurement | Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force microscope (PFM), magnetic force microscope (MFM), force curve |
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