Basic-type Atomic Force Microscope
Basic-type Atomic Force Microscope - AtomExplorer
The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Kelvin Force Microscopy (KFM), and Atomic Force Microscopy (AFM). It offers high stability, excellent expandability, and customization services. As a high-precision topography characterization tool and a device for high-nanoscale magnetic and electrical measurements, it provides additional options and support for education, scientific research and industrial R&D.
| Item | Details |
|---|---|
| Sample Size | Φ 25 mm |
| Scanning Method | XYZ Three-Axis Full-Sample Scanning |
| Scanning Range | 100 μm×100 μm×10 μm / 30 μm×30 μm×5 μm |
| Z-Axis Noise Level | 0.04 nm |
| Tip Protection Technology | Safe Needle Insertion Mode |
| Image Sampling Points | 32×32-4096×4096 |
| Operating Mode | Tap Mode, Contact Mode,Lift Mode, Phase Imaging Mode |
| Multifunctional Measurements | Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM) |
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