Chip Multilayer Ceramic Capacitors muRata GRM1555C1H180FA01D 18pF 50V C0G Temperature Characteristics
Price:
Negotiable
MOQ:
Negotiable
Delivery Time:
Negotiable
Product Description
Product Overview
Chip Multilayer Ceramic Capacitors for General Purpose, suitable for general electronic equipment. This product specification applies to the GRM1555C1H180FA01 model.
Product Attributes
- Brand: MURATA
Technical Specifications
| MURATA Part No. | Size Code | Temperature Characteristics | Rated Voltage | Nominal Capacitance | Capacitance Tolerance | Packaging Code | Dimensions (mm) L/W | Dimensions (mm) T | Packaging Unit |
| GRM1555C1H180FA01 | 0402 | C0G (EIA) | DC 50 V | 18pF | +/- 1 % | D (10000 pcs./Reel, 180mm Reel PAPER Tape) | 0.15 to 0.35 | 0.3 min. | 10000 pcs./Reel |
| GRM1555C1H180FA01 | 0402 | C0G (EIA) | DC 50 V | 18pF | +/- 1 % | J (50000 pcs./Reel, 330mm Reel PAPER Tape) | 0.15 to 0.35 | 0.3 min. | 50000 pcs./Reel |
| GRM1555C1H180FA01 | 0402 | C0G (EIA) | DC 50 V | 18pF | +/- 1 % | A01 (20000 pcs./Reel, 180mm Reel PAPER Tape) | 0.15 to 0.35 | 0.3 min. | 20000 pcs./Reel |
Specifications and Test Methods
General
| Item | Specification | Test Method (Ref. Standard:JIS C 5101, IEC60384) |
| Rated Voltage | Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. When AC voltage is superimposed on DC voltage, VP-P or VO-P, whichever is larger, should be maintained within the rated voltage range. | |
| Appearance | No defects or abnormalities. | Visual inspection. |
| Dimension | Shown in Rated value. | Using Measuring instrument of dimension. |
| Voltage Proof | No defects or abnormalities. | Measurement Point : Between the terminations Test Voltage : 300% of the rated voltage Applied Time : 1s to 5s Charge/Discharge Current : 50mA max. |
| Insulation Resistance(I.R.) | More than 10000M | Measurement Temperature:Room Temperature Measurement Point : Between the terminations Measurement Voltage : Rated Voltage Charging Time : 2min Charge/Discharge Current : 50mA max. |
| Capacitance | Shown in Rated value. | Measurement Temperature:Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms |
| Q or Dissipation Factor (D.F.) | Q400+20C (C:Nominal Capacitance(pF)) | Measurement Temperature : Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms |
Temperature Characteristics
| Item | Specification | Test Method (Ref. Standard:JIS C 5101, IEC60384) |
| Capacitance | Nominal value of the temperature coefficient is shown in Rated value. The capacitance change should be measured after 5 minutes at each specified temperature stage. Capacitance Drift:Within +/-0.2% or +/-0.05pF (Whichever is larger) | Measurement Voltage : Less than 1.0Vrms (Refer to the individual data sheet) Step Temperature(C) Applying Voltage 1 Reference Temp. +/-2 2 Min. Operating Temp. +/-3 3 * Reference Temp. +/-2 4 Max. Operating Temp. 3 5 Reference Temp. +/-2 No bias |
Mechanical and Environmental Tests
| Item | Specification | Test Method (Ref. Standard:JIS C 5101, IEC60384) |
| Adhesive Strength of Termination | No removal of the terminations or other defect should occur. | Solder the capacitor on the test substrate shown in Fig.3. Termination Applied Force : 5N Holding Time : 10+/-1 Applied Direction : In parallel with the test substrate and vertical with the capacitor side |
| Vibration | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. Q or D.F.: Within the specified initial value. | Solder the capacitor on the test substrate shown in Fig.3. Kind of Vibration : A simple harmonic motion 10Hz to 55Hz to 10Hz Vibration Time : 1min Total Amplitude : 1.5mm This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours). |
| Substrate Bending Test | Appearance: No defects or abnormalities. Capacitance: Within +/-5% or +/-0.5pF (Whichever is larger) | Solder the capacitor on the test substrate shown in Fig.1. Pressurization Method : Shown in Fig.2. Flexure : 1mm Change Holding Time : 5+/-1s Soldering Method : Reflow soldering |
| Solderability | 95% of the terminations is to be soldered evenly and continuously. | Test Method : Solder bath method Flux : Solution of rosin ethanol 25(mass)% Preheat : 80 to 12010s to 30s Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Test Temp. : 245+/-5 Test Time : 2+/-0.5s |
| Resistance to Soldering Heat | Appearance: No defects or abnormalities. Capacitance: Within +/-2.5% or +/-0.25pF (Whichever is larger) Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects. | Test Method : Solder bath method Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Solder Temp. : 270+/-5 Test Time : 10+/-0.5s Preheat Temp. : 120 to 150 Preheat Time : 1min Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. |
| Temperature Sudden Change | Appearance: No defects or abnormalities. Capacitance: Within +/-2.5% or +/-0.25pF (Whichever is larger) Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects. | Solder the capacitor on the test substrate shown in Fig.3. Cycles : 5 cycles Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Step Temperature() Time (min) 1 Min.Operating Temp. +0/-3 30+/-3 2 Reference Temp. 2 to 3 3 Max.Operating Temp. +3/-0 30+/-3 4 Reference Temp. 2 to 3 |
| High Temperature High Humidity (Steady) | Appearance: No defects or abnormalities. Capacitance: Within +/-7.5% or +/-0.75pF (Whichever is larger) Q or D.F.: Q100+10C/3 (C:Nominal Capacitance(pF)) I.R.: More than 500M or 25F (Whichever is smaller) | Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : 40+/-2 Test Humidity : 90%RH to 95%RH (Steady) Test Time : 500+/-12h Test Voltage : Rated Voltage Charge/Discharge Current : 50mA max. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. |
| Durability | Appearance: No defects or abnormalities. Capacitance: Within +/-3% or +/-0.3pF (Whichever is larger) Q or D.F.: Q275+5C/2 (C:Nominal Capacitance(pF)) I.R.: More than 1000M or 50F (Whichever is smaller) | Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : Maximum Operating Temperature+/-3 Test Time : 1000+/-12h Test Voltage : 200% of the rated voltage Charge/Discharge Current : 50mA max. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. |
Packaging Details
| Minimum Quantity (pcs./reel) | Dimensions of Tape (mm) | Dimensions of Reel (mm) |
| 10000 (W8P2 Code:D) / 20000 (W8P1 Code:W) / 50000 (W8P2 Code:J) | F: 2.0+/-0.05, G: 2.0+/-0.05, H: 1.15(Typ.), C: 4.0+/-0.1, D: 1.75+/-0.1, E: 1.15(Typ.), J: 0.65(Typ.) | 180mm Reel: A: 8.0+/-0.3, B: 3.5+/-0.05, C: 0.5+/-0.05, D: 1.0+/-0.05, E: 0.05 max., w1: 10+/-1.5. 330mm Reel: A: 8.0+/-0.3, B: 3.5+/-0.05, C: 0.5+/-0.05, D: 1.0+/-0.05, E: 0.05 max., w1: 10+/-1.5. |
Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.
Company
Beijing Silk Road Enterprise Management Services Co., Ltd.
Location
16 Floor, Unit B, Jiatai International Mansion, No 41, Dongsihuan Zhong Road, Chaoyang District, Beijing
Contact Person
Sellina