Compact GIS High Voltage Test System for Partial Discharge Measurement and AC Withstand Testing
Product Description
SXGTU GIS Partial Discharge AC Withstand Test System
The SXGTU GIS Partial Discharge AC Withstand Test System is designed with a space-saving structure for high voltage partial discharge and withstand testing. The high voltage section is fully sealed in a shielded space, providing a reliable testing environment while reducing equipment installation requirements.
The system can control the overall partial discharge within 1–3 pC at rated voltage under normal environmental conditions. It features convenient connection with the test object and a durable structure designed to withstand long-distance transportation. The system supports high voltage transformer boosting and series resonance, with power-frequency and variable-frequency options available. All voltage boosting methods use single-stage boosting.
Product Parameters
| Parameter | Specification |
|---|---|
| Product Model | SXGTU |
| Voltage Range | 100–1000 kV |
| Capacity Range | 50–2000 kVA |
| Primary Voltage | 0.35–10 kV |
| Partial Discharge | 1–3 pC at Rated Voltage |
| High Voltage Method | Transformer Boosting / Series Resonance |
| Resonance Mode | Power Frequency / Variable Frequency |
| Boosting Structure | Single Stage |
| Temperature Rise | ≤65 K |
Product Advantages
- Compact structure allows installation in limited spaces.
- Direct connection with the test object simplifies test preparation.
- Durable construction supports long-distance transportation.
- Reduced system power capacity requirements improve installation flexibility.
Application Scenarios
- GIS high voltage testing
- GIS insulation testing
- Partial discharge testing
- AC withstand testing
- Electrical testing facilities
FAQ
Q1: Is the SXGTU compact in design?
A1: Yes, the system adopts a compact structure with lightweight components.
Q2: Can the equipment be transported over long distances?
A2: Yes, the durable structure is designed to withstand long-distance transportation.
Q3: How is the test object connected?
A3: The system can be directly connected with the test object.
Q4: Does the system reduce power requirements?
A4: Yes, the system design reduces the required power capacity.
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