FG FG-ST-C-16P-1030017
Price:
Negotiable
MOQ:
700
Delivery Time:
7-14 working days
Brand:
FG-ST-C-16P-1030017
Product Description
Product Overview
This specification covers the requirements for product performance and test methods for USB C TYPE plug and receptacle Connectors.
Brand FU GANG TECHNOLOGY CO., LTD.
Origin Shenzhen, China
Related Standards IEC512, MIL-STD 202, EIA-364
| ITEM | Description | Test Methods | Test Specification | Reference |
|---|---|---|---|---|
| 0B0B | Examination of Product | Visual inspection | Outward appearance shall be good without such injurious problem and structure shall be meet the design and dimension requirement of drawing. | EIA364-18 |
| 1B1B | Insertion force | Measure force at maximum rate of 12.5mm (0.492") per minute | The connector insertion force shall be the range from 5N to 20N | EIA 364-13 |
| 2B2B | Extraction force | Measure force at maximum rate of 12.5mm(0.492") per minute | The connector extraction force shall be the range from 8N to 20N | EIA 364-13 |
| 3 | Durability | Type C :5000 cycles cycle rate of 200cycles per hour manually | - Contact resistance (40m, delta 10m(Max) after test) - Insertion force (5N to 20N) - Extraction force (8N to 20N) - Visual inspection (no exposed base metal on contacts) | EIA 364-09 |
| 4 | Cable Flexing | 100 cycles in each of 2 planes 120 degree. Dimension x=3.7x cable diameter | No discontinuity over 1 microsecond During flexing or physical damage allowed | EIA 364-41 |
| 5 | Cable Pull-Out | 40N steady state axial load for 1 minute | No discontinuity or physical damage allowed | EIA-364-38 |
| 6 | 4-axes continuity test | No discontinuity greater than 1us and no physical damage to the specimen(one cable per test) | EIA364-18 | |
| 7-1 | Insulation Resistance | Unmated connecrors,apply 100Volts DC between adjacent terminal or ground. | 100m minimum(unmated)between adjacent contacts and contacts and shell | EIA 364-21C |
| 7-2 | Low Level Contact Resistance | 20mV Max. open circuit at 100mA Max. | 40m (Max) initial for VBUS and GND contacts and all other contacts; delta 10m (Max) after test | EIA 364-23b |
| 7-3 | Dielectric withstanding Voltage | Subjected to 100VAC (RMS) for 1 minute between adjacent terminals | There shall be no breakdown | EIA 364-20 |
| 7-4 | Contact current rating | 5.0A shall be applied collectively to VBUS pins and 1.25 A applied to the VCONN pin and 0.25 A the other contacts. When the currents are applied to the contacts, the temperature rise shall not exceed 30 C at any point on the USB Type-C mated plug and receptacle under test, when measured at an ambient temperature of 25 C. | EIA364-70 | |
| 8-1 | Temperature Life | 105 C without applied voltage for 120 hours. 105 C without applied voltage for 72 hours when used as preconditioning in EIA 364-1000.01. | Visual inspection, Test shall be done in sequences defined in EIA 364-1000.01. | EIA 364-17 |
| 8-2 | Thermal Shock | 10 Cycles -55 and +85. The USB 3.0 connectors under test must be mated. | There shall be no evidence of any physical damage. | EIA 364-32 |
| 8-3 | Salt Spray | Subject mated connectors to 24 hours at 35 with 5%-Salt-solution concentration. | 1).Shall meet visual requirement, show no physical damage. 2).Shall meet requirements of additional tests as specified in test sequence in Section 5 | MIL-STD-202F, Method 101D, Test Condition B |
| 8-4 | Cyclic Temperature and Humidity | cycle the connector or socket between 253at 80%3%RH and 653at 50%3%RH,ramp times should be 0.5hour and dwell times should be 1.0 hour.24 cycles | Visual inspection, Test shall be done in sequences defined in EIA 364-1000.01. | EIA 364-31 |
| 8-5 | Solder ability | soldered at temperature 260+/-5 at a rate of 25.4mm+/-6.35mm per second for in immersion duration 5s. | solder shall cover a minimum of 95% of the surface being immersed | EIA 364-52 |
| 8-6 | Resistance to Reflow Soldering Heat | No damage. | EIA 364-17A | |
| 8-7 | Temperature Life | Subject mated connectors to temperature life at 80 for 250hours | 1).Shall meet visual requirement, show no physical damage. 2).Shall meet requirements of additional tests as specified in test sequence in Section 5 | EIA 364-17 |
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Company
Shenzhen ECER Network Technology Co., Ltd.
Location
Unit A2603, One Avenue (South Zone), Zhuoyue Meilin Center Plaza, No. 126 Zhongkang Road, Meidu Community, Meilin Subdistrict, Futian District, Shenzhen
Contact Person
Sales