Probe Station

Precision Probe Station with XYZ Movement ±12.5mm and Temperature Range RT~1000℃ for Ultra-High-Temperature Testing Product Name: GoGo EH1000V-EM Ultra-High-Temperature Vacuum Probe Station with Extended-Range Precision (RT to 1000°C) Product Introduction The GoGo EH1000V-EM is a robust and sophisticated Precision Probe Station engineered to unlock the high-temperature electrical properties of next-generation materials. Designed for reliable, long-term operation at ultra-high

High-Precision Cryogenic Probe Station with External XYZ Movement, Low-Noise Triaxial BNC Current, and Precise Control from -190℃ to 400℃ Product Title: GoGo ECH400V-EB High-Precision Cryogenic Probe Station with External XYZ Manipulation (-190°C to 400°C) Product Introduction The GoGo ECH400V-EB represents a significant advancement in electrical characterization, engineered as a fully integrated cryogenic Probe Station for the most demanding semiconductor device testing and

Precision Probe Station with Peltier Temperature Control, XYZ Movement, and Low-Noise Triaxial BNC for Accurate Electrical Characterization Product Name: GoGo EPE120V-EM Eco-Friendly Precision Probe Station with Peltier Temperature Control (-25°C to 120°C) Product Introduction The GoGo EPE120V-EM is an advanced Precision Probe Station designed for clean, quiet, and highly stable electrical characterization of semiconductor devices and sensitive materials. Utilizing efficient

Precision Cryogenic Probe Station with Manual Micrometer Adjustment XYZ ±6mm and Low-Noise Triaxial BNC Current Paths for -190℃ to 400℃ Product Name: GoGo ECH400V-EM Micrometer-Adjustable Cryogenic Probe Station for Low-Noise Device Characterization (-190℃ to 400℃) Product Introduction The GoGo ECH400V-EM is a high-stability, cryogenic Probe Station engineered for the most demanding electrical characterization of semiconductor devices and delicate materials. It delivers

The GoGo ECH400V-MP Multi-Probe Vacuum Probe Station redefines flexibility in electrical device characterization with a comprehensive 6-probe configuration. Where standard 4-probe stations limit measurement topologies, the ECH400V-MP enables simultaneous multi-terminal access essential for Hall effect measurements, multi-gate transistor characterization, ring oscillator testing, and complex device structures requiring source, drain, gate, body, and substrate contacts

The GoGo ECH600V-HT High Temperature Probe Station is purpose-built for electrical characterization of wide-bandgap semiconductors, high-power electronic devices, and advanced materials at elevated temperatures up to 600°C. Operating within a sealed vacuum chamber, this Probe Station eliminates oxidation and thermal convection artifacts that plague open-air high-temperature measurements, enabling true intrinsic property determination of SiC, GaN, Ga2O3, and diamond-based

The GoGo ECH400V-QS Low-Noise Quantum Probe Station is engineered from the ground up for the most demanding low-signal electrical measurements in contemporary condensed matter physics and quantum device research. Where conventional Probe Stations introduce measurement artifacts that obscure the subtle transport signatures of quantum materials, the ECH400V-QS achieves sub-100 femtoamp leakage current through a meticulously designed guarded triaxial signal path, enabling