ICP-MS Sampler Cones
G3280-67040 Model Sampler Cone with High-purity Nickel Tip and Oxygen-free Copper Base for Precision Sampling
Sampler Cone, WA220101-Ni Component Type Sampler Cone (First Interface Cone) Compatible Instrument Agilent 7700/7800/7900/8800/8900 Series ICP-MS (x-lens system) Chemical Compatibility Aqueous solutions Tip Material High-purity nickel (Ni) Substrate Material Oxygen-free copper (Cu) Orifice Diameter 1.0 mm (standard) Lens System x-lens Packaging Specification 1 piece per pack Recommended Application Aqueous matrices, acid matrices, HF-free solutions, non-organic samples Key
High-purity Nickel Sampler Cone with Platinum Option for Precision Sampling
Sampler Cone, WB210101-Ni Component Type Sampler Cone (First Interface Cone) Compatible Instrument PerkinElmer NexION 300/350/1000/2000/5000 Series ICP-MS Core Material High-purity nickel (Ni); platinum (Pt) optional Orifice Diameter 1.1 mm (Standard, with anti-clogging design) Mounting Interface 2 threaded mounting holes, circular flange design, compatible with standard interface chambers Core Function Extracts the initial ion beam from the argon plasma; provides the first
High-Purity Nickel Tip Sampler Cone with Oxygen-Free Copper Base and Nickel Alloy Structure for Precision Sampling
Sampler Cone, WS200101-Ni/Cu Component Type Sampler Cone (First Interface Cone) Official OEM Model 3600812 (Nickel, Standard version) Compatible / Replacement Model 3601289 (Platinum, for HF / high-salinity samples) Compatible Instrument Qnova Series ICP-MS system Tip Material High-purity nickel (Ni, 99.9%) Substrate Material Oxygen-free copper (Cu) / Nickel alloy (the actual structure is all-nickel, used for the Compatible version) Orifice Diameter 1.1 mm Mounting Interface