Figure 2 IEC 61032 Test Finger Probe B With Baffle Diameter 125mm
IEC60335-2-14 Large Baffle Test Finger Probe B With Baffle Diameter 125 mm
Standard: IEC60335-2-14 IEC 61032 figure 2, IEC60950 figure 2A, IEC60884, UL507, and UL1278 figure 8.4.
Application: This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger. Test Finger Probe
Test sample: Easily accessible enclosure live parts or mechanical parts.
Feature: This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer). Test Finger Probe
Parameters(mm):
| Model | HT-I02B |
| Name | Large Baffle Test Finger B |
| Joint 1 | 30 |
| Joint 2 | 60 |
| Finger length | 100 |
| Baffle diameter | Ф125 |
| Baffle thickness | 80 |
| Guard diameter | 75 |
Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.