10x10x0.5mm GAGG Ce Single Crystal Substrates - 6.63 g/cm³ Density, >50,000 Photons/MeV Light Yield for Medical Imaging and Gamma Detection
Price:
USD 66/pc
MOQ:
1pc
Delivery Time:
1-2 weeks
Brand:
Crystro
Product Description
Gd3Al2Ga3O12 Ce GAGG Single Crystal Substrates
These 10×10×0.5mm Ce-doped GAGG single crystal substrates represent advanced scintillator technology for high-energy detection applications. Grown using the Czochralski method, these substrates achieve industry-leading 3-inch diameters with exceptional surface roughness under 0.5nm.
Technical Specifications
| Parameter | Value |
|---|---|
| Dimensions | 10×10×0.5mm |
| Density | 6.63 g/cm³ |
| Light Yield | >50,000 photons/MeV |
| Emission Peak | 540nm |
| Surface Roughness | <0.5nm |
Key Performance Features
- High density for superior stopping power
- Exceptional light output exceeding 50,000 photons/MeV
- Fast decay time for rapid detection
- Excellent energy resolution capabilities
- Chemically inert and mechanically robust
- High sensitivity to gamma radiation
Radiation Performance
Demonstrated stability under high-energy X-ray irradiation at 115kV, 3mA with radiation source positioned 150mm from crystal. Performance remains consistent after 20 hours of continuous operation, indicating excellent radiation resistance for demanding applications.
Primary Applications
- Single Photon Emission Computed Tomography (SPECT)
- Medical Imaging: PET, PEM, and CT systems
- Gamma-ray and Compton electron detection
- High-energy industrial non-destructive testing
- Nuclear physics and space applications
Custom Manufacturing: Available in custom sizes and specifications to meet specific application requirements.
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Company
ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd.
Location
No. 176, Yuner Rd, Yunhai Rd Industrial Park, Baohe District，Hefei City，Anhui Province
Contact Person
Wu