S300 DC SMU Source Measure Unit 300V 1A For Electrical Characteristic Testing
S300 DC SMU Source Measure Unit 300V 1A For Electrical Characteristic Testing
The S300 Source Measure Unit, developed by PRECISE INSTRUMENT over many years, is a high-precision, wide dynamic range, and digitally interactive domestically produced source meter. It integrates multiple functions such as voltage and current input/output and measurement. With a maximum output voltage of 300V, a maximum output current of 1A, and a minimum test current resolution of 10pA, it supports four-quadrant operation, making it widely applicable for various electrical characteristic testing and analysis, including semiconductor ICs, components, power devices, sensors, organic materials, and nanomaterials.
Product Features
▪ High-Precision Measurement: Provides high-accuracy voltage and current measurements, suitable for low-current and high-impedance testing.
▪Multi-Functional Integration: Combines voltage source, current source, voltmeter, and ammeter functionalities, supporting multiple testing modes.
▪ Wide Range: Offers a broad voltage and current output range to meet diverse testing needs.
▪ High Resolution: Delivers high-resolution output and measurement, ideal for precision testing.
▪ Four-Quadrant Operation: Supports four-quadrant operation, capable of both sourcing and sinking power to simulate real-world working conditions.
▪ Multiple Interfaces: Equipped with GPIB, USB, LAN, and other interfaces for easy integration and remote control.
▪ User-Friendly Interface: Features an intuitive graphical interface and easy-to-use software, enhancing user experience.
Product Parameters
|
Items |
Parameters |
|
V-Ranges |
300 mV-300 V |
|
I-Ranges |
100 nA-1 A |
|
Accuracy |
0.1% |
|
Power Limits |
DC Mode:max 30W |
|
Over-range Capability |
105% of range, for sourcing and measurement |
|
Sweep Types |
Linear, Log, Custom |
|
Stable Load Capacitance |
<22nF |
|
Wideband Noise |
2mV RMS (typical), <20mV Vp-p (typical) |
|
Cable Guard Voltage |
Output impedance 30KΩ, output voltage offset <80mV |
|
Maximum Sampling Rate |
S series 1000S/s, SXXB series 32000S/s |
|
Programming |
SCPI |
|
Triggering |
Supports IO trigger input and output, trigger polarity configurable |
|
Output Interface |
Front/Rear Banana Jacks |
|
Communication Port |
RS-232, GPIB, Ethernet |
|
Power Supply |
AC 100~240V 50/60Hz |
|
Operating Environment |
25±10℃ |
|
Dimensions (LWH) |
425mm × 255mm × 106mm |
|
Weight |
5Kg |
|
Warranty Period |
1 year |
Applications
▪ Semiconductor Testing: Used for characterizing devices such as diodes, transistors, and MOSFETs.
▪ Material Research: Applied in the study of electrical properties of new materials.
▪ Electronic Component Testing: Used for testing components like resistors, capacitors, and inductors.
▪ Research and Education: Suitable for scientific research experiments and educational demonstrations.
▪ Automated Testing Systems: Can be integrated into automated testing systems to improve testing efficiency.
Get in Touch
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