Semiconductors Source Measurement Unit 100V 1A 10A Pulse Source Meter Unit P200
Semiconductors Source Measurement Unit 100V 1A 10A Pulse Source Meter Unit P200
The P200 Benchtop Pulse Source Meter is a high-performance test instrument designed to integrate precision measurement, wide dynamic-range output, and intuitive digital touch operation. Featuring a 5-inch touchscreen with smartphone-like simplicity, the P200 delivers up to 100V output and 10A pulsed current while supporting four-quadrant operation. Ideal for testing low-power microelectronics to high-voltage power devices, it serves as a versatile tool for characterizing semiconductors, nanomaterials, organic electronics, printed electronics, and other small-scale, low-power components.
Product Features
▪ Precision & Reliability: Advanced measurement technology ensures accuracy from 1pA to 10A pulsed currents, guaranteeing trustworthy data for critical applications.
▪ User-Friendly Interface: Streamlined graphical interface with a 5-inch touchscreen simplifies complex setups, even for novice users.
▪ Wide Testing Range: Covers 1pA–1A DC and 10A pulsed currents, 0–100V voltage, supporting sensors, power modules, and low-power devices.
▪ Stable Pulse Output: Achieves a minimum pulse width of 200μs with precise control, ideal for high-speed semiconductor testing.
▪ Flexible Operation Modes: Bidirectional current sourcing/sinking (source/sink modes) simulates real-world scenarios, including energy recovery testing.
▪ Advanced Scanning: Linear, logarithmic, and custom sweeps optimize I-V characterization for materials or devices with nonlinear behaviors.
▪ Efficient Data Management: USB storage and one-click report generation streamline data analysis and sharing.
▪ Seamless Integration: RS-232, GPIB, and LAN interfaces enable ATE system integration and remote control.
Product Parameters
|
Items |
Parameters |
|
V-Ranges |
300 mV-100V |
|
I-Ranges |
Pulse Mode: 10nA–10A DC Mode: 10nA–1A |
|
Power Limits |
DC Mode:max 30W /Pulse Mode: max 300W |
|
Minimum Pulse Width |
200μs |
|
Sampling Rate |
100,000 S/s |
|
Accuracy |
±0.1% |
|
Triggering: Configurable I/O trigger polarity |
I/O trigger polarity |
|
Display |
5-inch touchscreen |
|
Interfaces |
RS-232, GPIB, LAN |
|
Storage |
USB support |
|
Power Supply |
100–240V AC, 50/60Hz |
Applications
▪ Semiconductor Industry: Test reverse leakage in diodes, switching characteristics of MOSFETs, and high-temperature performance of SiC devices for R&D and quality control.
▪ Energy & Display Tech: Measure LED/AMOLED brightness, chromaticity, and power efficiency. Evaluate solar cell conversion rates and battery charge/discharge cycles.
▪ Sensor Validation: Ensure linearity of pressure sensors, sensitivity of temperature sensors, and reliability for IoT and industrial automation.
▪Materials Science: Characterize e-ink for flexible displays, graphene/nanowire conductivity, and organic semiconductors for next-gen electronics.
Get in Touch
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