1010C Multi Channel SMU Unit For Test Semiconductor And Material Characterization

    The 1010C modular chassis integrates cutting-edge technology with innovative engineering, delivering a high-performance testing solution tailored for diverse demands in modern R&D and industrial applications. This highly adaptable platform features a unified architecture supporting seamless adaptation of interchangeable functional sub-cards, enabling precision execution of complex test scenarios across semiconductor validation, advanced material characterization, and multi-channel sensor calibration.

Product Features

▪ Multi-channel Synchronization: Flexible configuration of sub-card quantity/types.

▪ High-speed Transmission: 3Gbps backplane bandwidth and 16-channel trigger bus ensure μs-level synchronization accuracy.

▪ Standard Size: 19-inch standard rack compatibility for space-efficient integration.

▪ Industrial Reliability: Multi-layer EMI shielding and intelligent air-cooling system.

▪ Multi-Protocol Interfaces: GPIB/RS-232/Gigabit Ethernet interfaces for seamless connectivity.

▪ SCPI Command Support: Enables cross-platform device cascading control.

▪ Broad Compatibility: Seamless integration with Pusces CS/CBI series sub-cards.

Product Parameters

Applications

▪ Power Semiconductors: Used for various tests of power semiconductors represented by SiC (Silicon Carbide) and GaN (Gallium Nitride), including breakdown voltage testing and aging testing, providing data support for the research and development and quality inspection of power semiconductors.

▪ Discrete Devices: Can conduct withstand voltage tests on discrete devices such as diodes and transistors, ensuring that the performance of these devices meets standards under different voltage environments.

▪ Integrated Circuits: In the fields of integrated circuits and microelectronics, it is used for chip - related tests to ensure the stability and reliability of chips in high - voltage environments.

▪ Material Research: For the study of the electrical properties of semiconductor materials, through high - voltage output and measurement functions, the characteristics of materials are analyzed, contributing to the research and development of new semiconductor materials.

▪ Sensors: Provides performance verification test solutions for various sensors, simulates high - voltage environments, and detects the performance of sensors under extreme voltage conditions.

▪ Teaching Field: Provides professional equipment for integrated circuit and microelectronics teaching laboratories, helping students learn the principles and operation methods of high - voltage testing and improving their practical abilities.