300V 1A Modular SMU Unit Single Channel Sub Card DC Source Measurement Unit CS300
300V 1A Modular SMU Unit Single Channel Sub Card DC Source Measurement Unit CS300
The CS300 modular subcard is a core member of the CS Series high-precision Source-Measure Units (SMUs), engineered for high-voltage, high-accuracy electrical characterization. As a single-channel SMU module, it integrates seamlessly into 1003CS or 1010CS host systems, supporting four-quadrant operation (sourcing/sinking modes) to address precision testing demands in semiconductor devices, nanomaterials, and sensors. With a maximum output of 300V/1A, combined with high dynamic range and synchronized triggering, it delivers exceptional stability in complex test scenarios such as power device stress testing and thin-film material analysis.
Product Features
▪ Standard SCPI Command Set: Simplifies automation integration and custom scripting.
▪ Multi-subcard Flexibility: Scalable architecture for parallel testing configurations.
▪ Optimized Host Software: Pre-installed universal host software with <10 ms command latency.
▪ End-to-End Testing Ecosystem: Unified solutions spanning semiconductor materials to device validation.
▪ Space-efficient Modularity: 1U-height design maximizes rack density while minimizing footprint.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
1 channels |
|
Voltage Range |
300mV~300V |
|
Minimum Voltage Resolution |
30uV |
|
Current Range |
100nA~1A |
|
Minimum Current Resolution |
10pA |
|
Maximum Continuous Wave (CW) Output Power |
30W, 4-quadrant source or sink mode |
|
Voltage Source Limits |
±30V (for the range ≤1A), ±300V (for the range ≤100mA) |
|
Current Source Limits |
±1A (for the range ≤30V), ±100mA (for the range ≤300V) |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:IV characterization and dynamic parameter testing of discrete devices (MOSFETs, BJTs, SiC devices).
▪ Nanomaterial & Organic Research:Conductivity and charge carrier property evaluation for graphene, nanowires, and organic semiconductor materials.
▪ Energy Device Efficiency Validation:Efficiency analysis and load regulation characterization of solar cells and DC-DC converters.Sensor & Precision Component Testing.Hall-effect sensor validation, resistivity measurement, and long-term stability testing for low-power devices.
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